2008 IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems
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A Framework to Evaluate the Trade-Off among AVF, Performance and Area of Soft Error Tolerant Microprocessors

2008 IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems ◽

10.1109/dft.2008.9 ◽

2008 ◽

Cited By ~ 1

Author(s):

Rui Gong ◽

Kui Dai ◽

Zhiying Wang

Keyword(s):

Soft Error ◽

Trade Off

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Fault Detection of Bloom Filters for Defect Maps

2008 IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems ◽

10.1109/dft.2008.41 ◽

2008 ◽

Cited By ~ 1

Author(s):

Jae-Young Choi ◽

Yoon-Hwa Choi

Keyword(s):

Fault Detection ◽

Bloom Filters

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Fault-Tolerance with Graceful Degradation in Quality: A Design Methodology and its Application to Digital Signal Processing Systems

2008 IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems ◽

10.1109/dft.2008.43 ◽

2008 ◽

Cited By ~ 3

Author(s):

Nilanjan Banerjee ◽

Charles Augustine ◽

Kaushik Roy

Keyword(s):

Signal Processing ◽

Fault Tolerance ◽

Digital Signal Processing ◽

Design Methodology ◽

Digital Signal ◽

Graceful Degradation ◽

Signal Processing Systems

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XOR-Based Low Cost Checkers for Combinational Logic

2008 IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems ◽

10.1109/dft.2008.35 ◽

2008 ◽

Cited By ~ 3

Author(s):

Carlos Arthur Lang Lisboa ◽

Luigi Carro

Keyword(s):

Low Cost ◽

Combinational Logic

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A Low-Power Safety Mode for Variation Tolerant Systems-on-Chip

2008 IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems ◽

10.1109/dft.2008.17 ◽

2008 ◽

Cited By ~ 3

Author(s):

David Wolpert ◽

Paul Ampadu

Keyword(s):

Low Power ◽

Systems On Chip ◽

Power Safety ◽

On Chip

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Error Detection and Tolerance for Scaled Electronic Technologies

2008 IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems ◽

10.1109/dft.2008.65 ◽

2008 ◽

Cited By ~ 1

Author(s):

Kartik Mohanram

Keyword(s):

Error Detection ◽

Electronic Technologies

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Error Detect Logic Resulting in Faster Address Generate and Decode for Caches

2008 IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems ◽

10.1109/dft.2008.60 ◽

2008 ◽

Author(s):

Prashant D. Joshi

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Material Fatigue and Reliability of MEMS Accelerometers

2008 IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems ◽

10.1109/dft.2008.37 ◽

2008 ◽

Cited By ~ 14

Author(s):

Xingguo Xiong ◽

Yu-Liang Wu ◽

Wen-Ben Jone

Keyword(s):

Material Fatigue ◽

Mems Accelerometers

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A BIST Technique for Crosstalk Noise Detection in FPGAs

2008 IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems ◽

10.1109/dft.2008.14 ◽

2008 ◽

Cited By ~ 4

Author(s):

Waleed K. Al-Assadi ◽

Sindhu Kakarla

Keyword(s):

Noise Detection ◽

Crosstalk Noise

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A Novel Error Detection and Correction Technique for RNS Based FIR Filters

2008 IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems ◽

10.1109/dft.2008.32 ◽

2008 ◽

Cited By ~ 10

Author(s):

S. Pontarelli ◽

G.C. Cardarilli ◽

M. Re ◽

A. Salsano

Keyword(s):

Error Detection ◽

Fir Filters ◽

Correction Technique ◽

Error Detection And Correction

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2008 IEEE International Symposium on Defect and Fault Tolerance of VLSI SystemsLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

A Framework to Evaluate the Trade-Off among AVF, Performance and Area of Soft Error Tolerant Microprocessors

Fault Detection of Bloom Filters for Defect Maps

Fault-Tolerance with Graceful Degradation in Quality: A Design Methodology and its Application to Digital Signal Processing Systems

XOR-Based Low Cost Checkers for Combinational Logic

A Low-Power Safety Mode for Variation Tolerant Systems-on-Chip

Error Detection and Tolerance for Scaled Electronic Technologies

Error Detect Logic Resulting in Faster Address Generate and Decode for Caches

Material Fatigue and Reliability of MEMS Accelerometers

A BIST Technique for Crosstalk Noise Detection in FPGAs

A Novel Error Detection and Correction Technique for RNS Based FIR Filters

2008 IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems
Latest Publications