Analysis of Electronic States at SiC MOS Interface Based on Empirical Pseudopotential Method

Author(s):  
Sachika Nagamizo ◽  
Hajime Tanaka ◽  
Nobuya Mori
2014 ◽  
Vol 2 (3) ◽  
pp. 58-72
Author(s):  
Pierre Ziade ◽  
Christophe Palermo ◽  
Antonio Khoury ◽  
Roland Habchi ◽  
Myriam Rahal ◽  
...  

2013 ◽  
Vol 61 ◽  
pp. 129-133 ◽  
Author(s):  
J.-M. Masur ◽  
R. Rehm ◽  
J. Schmitz ◽  
L. Kirste ◽  
M. Walther

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