Precision low frequency noise measurement

2017 ◽

Cited By ~ 3

Author(s):

V. E. Ivanov En Un Chye

Keyword(s):

Low Frequency ◽

Noise Measurement ◽

Frequency Noise ◽

Low Frequency Noise ◽

Multichannel System

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Low-Frequency Noise Measurement and Parameters Extraction for Semiconductor Lasers

Applied laser ◽

10.3788/al20143404.0355 ◽

2014 ◽

Vol 34 (4) ◽

pp. 355-358

Author(s):

曹军胜 Cao Junsheng ◽

张俊 Zhang Jun ◽

郜峰利 Gao Fengli ◽

宁永强 Ning Yongqiang

Keyword(s):

Semiconductor Lasers ◽

Low Frequency ◽

Noise Measurement ◽

Frequency Noise ◽

Low Frequency Noise ◽

Parameters Extraction

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Understanding negative bias temperature stress in p-channel trench-gate power MOSFETs by low-frequency noise measurement

2014 IEEE 26th International Symposium on Power Semiconductor Devices & IC's (ISPSD) ◽

10.1109/ispsd.2014.6856001 ◽

2014 ◽

Cited By ~ 3

Author(s):

P. Magnone ◽

G. Barletta ◽

P.A. Traverso ◽

A. Magri ◽

E. Sangiorgi ◽

...

Keyword(s):

Temperature Stress ◽

Low Frequency ◽

Noise Measurement ◽

Frequency Noise ◽

Negative Bias ◽

Low Frequency Noise ◽

Power Mosfets ◽

Bias Temperature Stress

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Latent Damage Generation in Thin Oxides of Metal-Oxide-Semiconductor Devices under High-Field Impulse Stress and Damage Characterization Using Low-Frequency Noise Measurement

Japanese Journal of Applied Physics ◽

10.1143/jjap.40.6770 ◽

2001 ◽

Vol 40 (Part 1, No. 12) ◽

pp. 6770-6777 ◽

Cited By ~ 3

Author(s):

Wai Kin Chim ◽

Peng Soon Lim

Keyword(s):

Metal Oxide ◽

High Field ◽

Semiconductor Devices ◽

Low Frequency ◽

Metal Oxide Semiconductor ◽

Noise Measurement ◽

Oxide Semiconductor ◽

Frequency Noise ◽

Low Frequency Noise ◽

Damage Characterization

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Experimental validation of electromigration by low frequency noise measurement for advanced copper interconnects application

2015 International Conference on Noise and Fluctuations (ICNF) ◽

10.1109/icnf.2015.7288613 ◽

2015 ◽

Cited By ~ 3

Author(s):

B. J. Tang ◽

K. Croes ◽

E. Simoen ◽

S. Beyne ◽

C. Adelmann ◽

...

Keyword(s):

Experimental Validation ◽

Low Frequency ◽

Copper Interconnects ◽

Noise Measurement ◽

Frequency Noise ◽

Low Frequency Noise

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Highly sensitive graphene-based chemical and biological sensors with selectivity achievable through low-frequency noise measurement — Theoretical considerations

2014 29th International Conference on Microelectronics Proceedings - MIEL 2014 ◽

10.1109/miel.2014.6842108 ◽

2014 ◽

Author(s):

Z. G. Djuric ◽

I. M. Jokic ◽

A. Peles

Keyword(s):

Low Frequency ◽

Noise Measurement ◽

Frequency Noise ◽

Biological Sensors ◽

Low Frequency Noise ◽

Highly Sensitive ◽

Theoretical Considerations ◽

Chemical And Biological Sensors

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Low frequency noise measurement in YBa2Cu3Ox thick films

Physica B Condensed Matter ◽

10.1016/s0921-4526(09)80288-3 ◽

1990 ◽

Vol 165-166 ◽

pp. 1405-1406 ◽

Cited By ~ 1

Author(s):

K.-H. Yon ◽

J.C. Park

Keyword(s):

Thick Films ◽

Low Frequency ◽

Noise Measurement ◽

Frequency Noise ◽

Low Frequency Noise

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Low Frequency Noise Measurement and Analysis of Capacitive Micro-Accelerometers: Temperature Effect

Japanese Journal of Applied Physics ◽

10.1143/jjap.47.5270 ◽

2008 ◽

Vol 47 (6) ◽

pp. 5270-5273 ◽

Cited By ~ 6

Author(s):

Faisal Mohd-Yasin ◽

David J. Nagel ◽

D. S. Ong ◽

Can E. Korman ◽

H. T. Chuah

Keyword(s):

Temperature Effect ◽

Low Frequency ◽

Noise Measurement ◽

Frequency Noise ◽

Low Frequency Noise ◽

Measurement And Analysis

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Low Frequency Noise Measurement and Analysis of Capacitive Micro-Accelerometers: Temperature Effect

2007 Digest of papers Microprocesses and Nanotechnology ◽

10.1109/imnc.2007.4456261 ◽

2007 ◽

Author(s):

F. Mohd-Yasin ◽

D.J. Nagel ◽

D.S. Ong ◽

C.E. Korman ◽

H.T. Chuah

Keyword(s):

Temperature Effect ◽

Low Frequency ◽

Noise Measurement ◽

Frequency Noise ◽

Low Frequency Noise ◽

Measurement And Analysis

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Temperature dependency and reliability of through substrate via InAlN/GaN high electron mobility transistors as determined using low frequency noise measurement

Japanese Journal of Applied Physics ◽

10.7567/jjap.55.056502 ◽

2016 ◽

Vol 55 (5) ◽

pp. 056502 ◽

Cited By ~ 1

Author(s):

Hsien-Chin Chiu ◽

Li-Yi Peng ◽

Hou-Yu Wang ◽

Hsiang-Chun Wang ◽

Hsuan-Ling Kao ◽

...

Keyword(s):

Electron Mobility ◽

Low Frequency ◽

High Electron Mobility Transistors ◽

Noise Measurement ◽

Frequency Noise ◽

High Electron ◽

Temperature Dependency ◽

Low Frequency Noise ◽

High Electron Mobility ◽

Electron Mobility Transistors

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Precision low frequency noise measurement

Universal multichannel system for low frequency noise measurement

Low-Frequency Noise Measurement and Parameters Extraction for Semiconductor Lasers

Understanding negative bias temperature stress in p-channel trench-gate power MOSFETs by low-frequency noise measurement

Latent Damage Generation in Thin Oxides of Metal-Oxide-Semiconductor Devices under High-Field Impulse Stress and Damage Characterization Using Low-Frequency Noise Measurement

Experimental validation of electromigration by low frequency noise measurement for advanced copper interconnects application

Highly sensitive graphene-based chemical and biological sensors with selectivity achievable through low-frequency noise measurement — Theoretical considerations

Low frequency noise measurement in YBa2Cu3Ox thick films

Low Frequency Noise Measurement and Analysis of Capacitive Micro-Accelerometers: Temperature Effect

Low Frequency Noise Measurement and Analysis of Capacitive Micro-Accelerometers: Temperature Effect

Temperature dependency and reliability of through substrate via InAlN/GaN high electron mobility transistors as determined using low frequency noise measurement

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