Determination of thickness and dielectric constant of coatings from capacitance measurements

2005 IEEE Instrumentationand Measurement Technology Conference Proceedings ◽

10.1109/imtc.2005.1604163 ◽

2006 ◽

Author(s):

A. Guadanama-Santana ◽

A. Garcia-Valenzuela

Keyword(s):

Dielectric Constant ◽

Capacitance Measurements

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Principles and Methodology for the Simultaneous Determination of Thickness and Dielectric Constant of Coatings With Capacitance Measurements

IEEE Transactions on Instrumentation and Measurement ◽

10.1109/tim.2006.887406 ◽

2007 ◽

Vol 56 (1) ◽

pp. 107-112 ◽

Author(s):

A. Guadarrama-Santana ◽

A. Garcia-Valenzuela

Keyword(s):

Dielectric Constant ◽

Simultaneous Determination ◽

Capacitance Measurements

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Determination of Thickness and Dielectric Constant of Coatings from Capacitance Measurements

IEEE Instrumentation & Measurement Magazine ◽

10.1109/mim.2007.4343564 ◽

2007 ◽

Vol 10 (5) ◽

pp. 26-31 ◽

Author(s):

A. Guadarrama-Santana ◽

A. Garcia-Valenzuela

Keyword(s):

Dielectric Constant ◽

Capacitance Measurements

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Use of transient capacitance measurements for direct determination of minority‐carrier lifetime in low‐doped metal‐oxide‐semiconductor structures

Applied Physics Letters ◽

10.1063/1.95008 ◽

1984 ◽

Vol 45 (1) ◽

pp. 52-53 ◽

Author(s):

U. Efron ◽

P. O. Braatz

Keyword(s):

Carrier Lifetime ◽

Minority Carrier ◽

Direct Determination ◽

Minority Carrier Lifetime ◽

Metal Oxide Semiconductor ◽

Oxide Semiconductor ◽

Capacitance Measurements ◽

Semiconductor Structures ◽

Transient Capacitance

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A new method for the determination of the dielectric constant in photoconductors

Il Nuovo Cimento B ◽

10.1007/bf02711422 ◽

1966 ◽

Vol 46 (2) ◽

pp. 210-216 ◽

Author(s):

A. Carrelli ◽

F. Fittipaldi ◽

L. Pauciulo

Keyword(s):

Dielectric Constant ◽

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Determination of thermodynamic temperature and4He virial coefficients between 4,2 K and 27,0 K by dielectric constant gas thermometry

10.1088/0026-1394/33/4/8 ◽

1996 ◽

Vol 33 (4) ◽

pp. 341-352 ◽

Author(s):

H Luther ◽

K Grohmann ◽

B Fellmuth

Keyword(s):

Dielectric Constant ◽

Virial Coefficients ◽

Thermodynamic Temperature ◽

Gas Thermometry

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On the Determination of Complex Dielectric Constant of Medium Loss Substances in the Microwave Region

The Journal of Chemical Physics ◽

10.1063/1.1748369 ◽

1951 ◽

Vol 19 (6) ◽

pp. 797-798

Author(s):

K. V. Krisna Prasad

Keyword(s):

Dielectric Constant ◽

Complex Dielectric Constant ◽

Microwave Region

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ChemInform Abstract: DETERMINATION OF SURFACE STATE DENSITY ON N-GALLIUM ARSENIDE AND N-GALLIUM PHOSPHIDE IN AQUEOUS ELECTROLYTES BY CAPACITANCE MEASUREMENTS

Chemischer Informationsdienst ◽

10.1002/chin.198001008 ◽

1980 ◽

Vol 11 (1) ◽

Author(s):

R. WEICHE ◽

J. WESTFAHL ◽

P. JANIETZ ◽

R. DEHMLOW

Keyword(s):

Gallium Arsenide ◽

Surface State ◽

Gallium Phosphide ◽

State Density ◽

Aqueous Electrolytes ◽

Capacitance Measurements ◽

Surface State Density

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Experimental determination of the dielectric constant of wheat grain and cluster straw in different moisture contents

Food Science & Nutrition ◽

10.1002/fsn3.1350 ◽

2019 ◽

Vol 8 (1) ◽

pp. 629-635 ◽

Author(s):

Mohammad Jafari ◽

Gholamreza Chegini ◽

Behrooz Rezaeealam ◽

Amir Abbas Shaygani Akmal

Keyword(s):

Dielectric Constant ◽

Experimental Determination ◽

Wheat Grain ◽

Moisture Contents

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First principle determination of dielectric constant of polar liquids by the extended RISM theory with the bridge diagrams concerning dipole-dipole interactions

Journal of Molecular Liquids ◽

10.1016/j.molliq.2019.111567 ◽

2019 ◽

Vol 294 ◽

pp. 111567

Author(s):

Yasuhiro Ikuta ◽

Fumio Hirata

Keyword(s):

Dielectric Constant ◽

First Principle ◽

Polar Liquids ◽

Dipole Interactions

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Determination of Hole and Electron Traps from Capacitance Measurements

Japanese Journal of Applied Physics ◽

10.1143/jjap.12.1011 ◽

1973 ◽

Vol 12 (7) ◽

pp. 1011-1019 ◽

Author(s):

Toshiaki Ikoma ◽

Bert Jeppsson

Keyword(s):

Electron Traps ◽

Capacitance Measurements

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