A new mechanism of leakage current in ultra-shallow junctions with TiSi/sub 2/ contacts

Author(s):  
Wai Shing Lau ◽  
Peng Wei Qian ◽  
Rong Zhao
2019 ◽  
Vol 3 (2) ◽  
pp. 57-65
Author(s):  
Hendriansyah Sauddin ◽  
Yuichiro Sasaki ◽  
Hiroyuki Ito ◽  
Bunji Mizuno ◽  
Parhat Ahmet ◽  
...  

2011 ◽  
Author(s):  
G. D. Papasouliotis ◽  
L. Godet ◽  
V. Singh ◽  
R. Miura ◽  
H. Ito ◽  
...  

Author(s):  
R. Lindsay ◽  
K. Henson ◽  
W. Vandervorst ◽  
K. Maex ◽  
B. J. Pawlak ◽  
...  

2013 ◽  
Vol 2 (5) ◽  
pp. P195-P204 ◽  
Author(s):  
Masahiro Yoshimoto ◽  
Masashi Okutani ◽  
Gota Murai ◽  
Shuji Tagawa ◽  
Hiroki Saikusa ◽  
...  

Author(s):  
Mark Law ◽  
Renata Camillo-Castillo ◽  
Lance Robertson ◽  
Kevin Jones

Sign in / Sign up

Export Citation Format

Share Document