Characterization and physical modeling of the temporal evolution of near-interfacial states resulting from NBTI/PBTI stress in nMOS/pMOS transistors

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B. Stampfer ◽  
M. Waltl ◽  
G. Rzepa ◽  
K. Rupp ◽  
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Alicia Escribano ◽  
María Jesús. Turrero ◽  
Pedro Luis. Martín ◽  
Javier Peña ◽  
...  
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2007 ◽  
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Jialu Wang ◽  
Shiyi Yuan ◽  
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Taixian Zhong ◽  
Xu Jia

2017 ◽  
Vol 50 (4-6) ◽  
pp. 471-484
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Wei XIONG ◽  
Haitao WANG ◽  
Zuwen WANG

2007 ◽  
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Raymond Soukup
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