Characterization and physical modeling of the temporal evolution of near-interfacial states resulting from NBTI/PBTI stress in nMOS/pMOS transistors
2020 ◽
Vol 13
(1)
◽
pp. 26
2001 ◽
Vol 28
(1-2)
◽
pp. 116-134
◽
2017 ◽
Vol 50
(4-6)
◽
pp. 471-484