Improved test pattern generation for sequential circuits using implicit enumeration

[Proceedings] 1992 IEEE International Symposium on Circuits and Systems ◽

10.1109/iscas.1992.230326 ◽

2003 ◽

Author(s):

E. Auth ◽

J. Kastner

Keyword(s):

Test Pattern ◽

Sequential Circuits ◽

Pattern Generation ◽

Test Pattern Generation ◽

Implicit Enumeration

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Analysis of optimization algorithms in automated test pattern generation for sequential circuits

2017 IEEE International Conference on Systems, Man, and Cybernetics (SMC) ◽

10.1109/smc.2017.8122883 ◽

2017 ◽

Author(s):

Majed M. Alateeq ◽

Witold Pedrycz

Keyword(s):

Test Pattern ◽

Optimization Algorithms ◽

Sequential Circuits ◽

Pattern Generation ◽

Test Pattern Generation ◽

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A comparative analysis of bio-inspired optimization algorithms for automated test pattern generation in sequential circuits

Applied Soft Computing ◽

10.1016/j.asoc.2020.106967 ◽

2021 ◽

Vol 101 ◽

pp. 106967

Author(s):

Majed Alateeq ◽

Witold Pedrycz

Keyword(s):

Comparative Analysis ◽

Test Pattern ◽

Optimization Algorithms ◽

Sequential Circuits ◽

Pattern Generation ◽

Test Pattern Generation ◽

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Automatic test pattern generation for sequential circuits using genetic algorithms

Proceedings Eleventh International Conference on VLSI Design ◽

10.1109/icvd.1998.646616 ◽

2002 ◽

Author(s):

V. Rajesh ◽

A. Jain

Keyword(s):

Genetic Algorithms ◽

Test Pattern ◽

Sequential Circuits ◽

Pattern Generation ◽

Test Pattern Generation ◽

Automatic Test Pattern Generation ◽

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Combinational automatic test pattern generation for acyclic sequential circuits

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2005.847894 ◽

2005 ◽

Vol 24 (6) ◽

pp. 948-956 ◽

Author(s):

Yong Chang Kim ◽

V.D. Agrawal ◽

K.K. Saluja

Keyword(s):

Test Pattern ◽

Sequential Circuits ◽

Pattern Generation ◽

Test Pattern Generation ◽

Automatic Test Pattern Generation ◽

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A test-pattern-generation algorithm for sequential circuits

IEEE Design & Test of Computers ◽

10.1109/54.82040 ◽

1991 ◽

Vol 8 (2) ◽

pp. 72-85 ◽

Author(s):

E. Auth ◽

M.H. Schulz

Keyword(s):

Test Pattern ◽

Sequential Circuits ◽

Pattern Generation ◽

Test Pattern Generation ◽

Generation Algorithm

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GATTO: a genetic algorithm for automatic test pattern generation for large synchronous sequential circuits

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/43.511578 ◽

1996 ◽

Vol 15 (8) ◽

pp. 991-1000 ◽

Author(s):

F. Corno ◽

P. Prinetto ◽

M. Rebaudengo ◽

M. Sonza Reorda

Keyword(s):

Genetic Algorithm ◽

Test Pattern ◽

Sequential Circuits ◽

Pattern Generation ◽

Test Pattern Generation ◽

Automatic Test Pattern Generation ◽

Automatic Test ◽

Synchronous Sequential Circuits

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Incremental SAT-Based Accurate Auto-Correction of Sequential Circuits Through Automatic Test Pattern Generation

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2018.2812123 ◽

2019 ◽

Vol 38 (2) ◽

pp. 245-252 ◽

Author(s):

Bijan Alizadeh ◽

Seyyed Reza Sharafinejad

Keyword(s):

Test Pattern ◽

Sequential Circuits ◽

Pattern Generation ◽

Test Pattern Generation ◽

Automatic Test Pattern Generation ◽

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Deterministic test pattern generation techniques for sequential circuits

IEEE/ACM International Conference on Computer Aided Design. ICCAD - 2000. IEEE/ACM Digest of Technical Papers (Cat. No.00CH37140) ◽

10.1109/iccad.2000.896528 ◽

2002 ◽

Author(s):

I. Hamzaoglu ◽

J.H. Patel

Keyword(s):

Test Pattern ◽

Sequential Circuits ◽

Pattern Generation ◽

Test Pattern Generation

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Application of Fault Parallelism to the Automatic Test Pattern Generation for Sequential Circuits

Parallel Computer Architectures - Lecture Notes in Computer Science ◽

10.1007/978-3-662-21577-7_17 ◽

1993 ◽

pp. 234-245 ◽

Author(s):

Peter A. Krauss ◽

Kurt J. Antreich

Keyword(s):

Test Pattern ◽

Sequential Circuits ◽

Pattern Generation ◽

Test Pattern Generation ◽

Automatic Test Pattern Generation ◽

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Automatic Test Pattern Generation Based on Shuffled Frog Leaping Algorithm for Sequential Circuits

Procedia Engineering ◽

10.1016/j.proeng.2012.01.054 ◽

2012 ◽

Vol 29 ◽

pp. 856-860 ◽

Author(s):

Aijun Zhu ◽

Li Zhi

Keyword(s):

Test Pattern ◽

Sequential Circuits ◽

Pattern Generation ◽

Test Pattern Generation ◽

Automatic Test Pattern Generation ◽

Shuffled Frog Leaping Algorithm ◽

Automatic Test ◽

Shuffled Frog Leaping

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