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A test-pattern-generation algorithm for sequential circuits
IEEE Design & Test of Computers
◽
10.1109/54.82040
◽
1991
◽
Vol 8
(2)
◽
pp. 72-85
◽
Cited By ~ 29
Author(s):
E. Auth
◽
M.H. Schulz
Keyword(s):
Test Pattern
◽
Sequential Circuits
◽
Pattern Generation
◽
Test Pattern Generation
◽
Generation Algorithm
Download Full-text
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Cited By
References
ESSENTIAL: an efficient self-learning test pattern generation algorithm for sequential circuits
10.1109/test.1989.82274
◽
2003
◽
Cited By ~ 46
Author(s):
M.H. Schulz
◽
E. Auth
Keyword(s):
Test Pattern
◽
Sequential Circuits
◽
Pattern Generation
◽
Test Pattern Generation
◽
Generation Algorithm
◽
Learning Test
◽
Self Learning
Download Full-text
Analysis of optimization algorithms in automated test pattern generation for sequential circuits
2017 IEEE International Conference on Systems, Man, and Cybernetics (SMC)
◽
10.1109/smc.2017.8122883
◽
2017
◽
Cited By ~ 1
Author(s):
Majed M. Alateeq
◽
Witold Pedrycz
Keyword(s):
Test Pattern
◽
Optimization Algorithms
◽
Sequential Circuits
◽
Pattern Generation
◽
Test Pattern Generation
◽
Automated Test
Download Full-text
A comparative analysis of bio-inspired optimization algorithms for automated test pattern generation in sequential circuits
Applied Soft Computing
◽
10.1016/j.asoc.2020.106967
◽
2021
◽
Vol 101
◽
pp. 106967
Author(s):
Majed Alateeq
◽
Witold Pedrycz
Keyword(s):
Comparative Analysis
◽
Test Pattern
◽
Optimization Algorithms
◽
Sequential Circuits
◽
Pattern Generation
◽
Test Pattern Generation
◽
Automated Test
Download Full-text
Improved test pattern generation for sequential circuits using implicit enumeration
[Proceedings] 1992 IEEE International Symposium on Circuits and Systems
◽
10.1109/iscas.1992.230326
◽
2003
◽
Author(s):
E. Auth
◽
J. Kastner
Keyword(s):
Test Pattern
◽
Sequential Circuits
◽
Pattern Generation
◽
Test Pattern Generation
◽
Implicit Enumeration
Download Full-text
Automatic test pattern generation for sequential circuits using genetic algorithms
Proceedings Eleventh International Conference on VLSI Design
◽
10.1109/icvd.1998.646616
◽
2002
◽
Cited By ~ 1
Author(s):
V. Rajesh
◽
A. Jain
Keyword(s):
Genetic Algorithms
◽
Test Pattern
◽
Sequential Circuits
◽
Pattern Generation
◽
Test Pattern Generation
◽
Automatic Test Pattern Generation
◽
Automatic Test
Download Full-text
A test pattern generation algorithm exploiting behavioral information
Proceedings Seventh Asian Test Symposium (ATS'98) (Cat. No.98TB100259)
◽
10.1109/ats.1998.741660
◽
2002
◽
Cited By ~ 2
Author(s):
S. Chiusano
◽
F. Corno
◽
P. Prinetto
Keyword(s):
Test Pattern
◽
Pattern Generation
◽
Test Pattern Generation
◽
Generation Algorithm
◽
Behavioral Information
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A diagnostic test pattern generation algorithm
Proceedings. International Test Conference 1990
◽
10.1109/test.1990.114000
◽
2002
◽
Cited By ~ 72
Author(s):
P. Camurati
◽
D. Medina
◽
P. Prinetto
◽
M. Sonza Reorda
Keyword(s):
Diagnostic Test
◽
Test Pattern
◽
Pattern Generation
◽
Test Pattern Generation
◽
Generation Algorithm
Download Full-text
Combinational automatic test pattern generation for acyclic sequential circuits
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
◽
10.1109/tcad.2005.847894
◽
2005
◽
Vol 24
(6)
◽
pp. 948-956
◽
Cited By ~ 3
Author(s):
Yong Chang Kim
◽
V.D. Agrawal
◽
K.K. Saluja
Keyword(s):
Test Pattern
◽
Sequential Circuits
◽
Pattern Generation
◽
Test Pattern Generation
◽
Automatic Test Pattern Generation
◽
Automatic Test
Download Full-text
GATTO: a genetic algorithm for automatic test pattern generation for large synchronous sequential circuits
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
◽
10.1109/43.511578
◽
1996
◽
Vol 15
(8)
◽
pp. 991-1000
◽
Cited By ~ 74
Author(s):
F. Corno
◽
P. Prinetto
◽
M. Rebaudengo
◽
M. Sonza Reorda
Keyword(s):
Genetic Algorithm
◽
Test Pattern
◽
Sequential Circuits
◽
Pattern Generation
◽
Test Pattern Generation
◽
Automatic Test Pattern Generation
◽
Automatic Test
◽
Synchronous Sequential Circuits
Download Full-text
Design and implementation of a parallel automatic test pattern generation algorithm with low test vector count
Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159)
◽
10.1109/test.2000.894246
◽
2002
◽
Cited By ~ 9
Author(s):
R. Butler
◽
B. Keller
◽
S. Paliwal
◽
R. Schoonover
◽
J. Swenton
Keyword(s):
Test Pattern
◽
Pattern Generation
◽
Test Pattern Generation
◽
Automatic Test Pattern Generation
◽
Test Vector
◽
Automatic Test
◽
Generation Algorithm
◽
Design And Implementation
Download Full-text
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