A statistical equivalent circuit modelling based on measured and de-embedded S-parameters
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Keyword(s):
2018 ◽
Vol 12
(10)
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pp. 1684-1690
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Keyword(s):
2020 ◽
Vol 14
(4)
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pp. 454-461
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2015 ◽
Vol 25
(4)
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pp. 183-185
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2006 ◽
Vol 19
(3)
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pp. 289-300