Modified Earliest Decoding for Random Network Codes

2011 ◽  
Author(s):  
Sune von Solms ◽  
Albert S. J. Helberg
Keyword(s):  
Random Network ◽  
Network Codes

Decoding of random network codes

2010 ◽  
Vol 46 (4) ◽  
pp. 300-320 ◽  
Author(s):  
E. M. Gabidulin ◽  
N. I. Pilipchuk ◽  
M. Bossert
Keyword(s):  
Random Network ◽  
Network Codes

A Hierarchical Multicast Scheme for Heterogeneous Receivers

2010 ◽  
Vol 108-111 ◽  
pp. 57-62 ◽  
Author(s):  
Jing Jing Si
Keyword(s):  
Network Coding ◽  
Source Coding ◽  
Random Network ◽  
Layered Multicast ◽  
Network Codes ◽  
Simulation Results ◽  
Multicast Scheme

We investigate inter-session network coding for networks with heterogeneous receivers in this paper. Based on layered source coding, we define the hierarchical inter-layer random network codes, and propose a hierarchical multicast scheme. Moreover, we compare our hierarchical multicast scheme with the layered multicast schemes in theory and with simulations. Simulation results show that our hierarchical multicast scheme can achieve the optimal aggregate throughput for some networks where the layered multicast schemes are suboptimal.

Application of Lattice Imaging Techniques to Amorphous Films

1975 ◽  
Vol 33 ◽  
pp. 8-9
Author(s):  
S. R. Herd ◽  
P. Chaudhari
Keyword(s):  
Nearest Neighbor ◽  
Random Network ◽  
Imaging Techniques ◽  
Network Models ◽  
Accurate Method ◽  
Direct Transmission ◽  
Lattice Imaging ◽  
Transmission Electron ◽  
Lattice Planes ◽  
Nearest Neighbor Distances

Electron diffraction and direct transmission have been used extensively to study the local atomic arrangement in amorphous solids and in particular Ge. Nearest neighbor distances had been calculated from E.D. profiles and the results have been interpreted in terms of the microcrystalline or the random network models. Direct transmission electron microscopy appears the most direct and accurate method to resolve this issue since the spacial resolution of the better instruments are of the order of 3Å. In particular the tilted beam interference method is used regularly to show fringes corresponding to 1.5 to 3Å lattice planes in crystals as resolution tests.

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