TASSER: A temperature-aware statistical soft-error-rate analysis framework for combinational circuits

Fifteenth International Symposium on Quality Electronic Design ◽

10.1109/isqed.2014.6783372 ◽

2014 ◽

Author(s):

Sung S.-Y. Hsueh ◽

Ryan H.-M. Huang ◽

Charles H.-P. Wen

Keyword(s):

Combinational Circuits ◽

Analysis Framework ◽

Soft Error Rate ◽

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GPU-Accelerated Soft Error Rate Analysis of Large-Scale Integrated Circuits

Soft Error Reliability of VLSI Circuits ◽

10.1007/978-3-030-51610-9_4 ◽

2020 ◽

pp. 45-54

Author(s):

Behnam Ghavami ◽

Mohsen Raji

Keyword(s):

Integrated Circuits ◽

Large Scale ◽

Soft Error Rate ◽

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Fast-Yet-Accurate Statistical Soft-Error-Rate Analysis Considering Full-Spectrum Charge Collection

IEEE Design and Test ◽

10.1109/mdt.2012.2194471 ◽

2013 ◽

Vol 30 (2) ◽

pp. 77-86 ◽

Author(s):

Hsuan-Ming Huang ◽

C. H-P Wen

Keyword(s):

Charge Collection ◽

Full Spectrum ◽

Soft Error Rate ◽

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Soft-Error-Rate-Analysis (SERA) Methodology

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2005.862738 ◽

2006 ◽

Vol 25 (10) ◽

pp. 2140-2155 ◽

Author(s):

M. Zhang ◽

N.R. Shanbhag

Keyword(s):

Soft Error Rate ◽

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An Efficient Approach for Soft Error Rate Estimation of Combinational Circuits

2014 17th Euromicro Conference on Digital System Design ◽

10.1109/dsd.2014.67 ◽

2014 ◽

Author(s):

Mohsen Raji ◽

Fereshte Saeedi ◽

Behnam Ghavami ◽

Hossein Pedram

Keyword(s):

Combinational Circuits ◽

Soft Error Rate ◽

Efficient Approach ◽

Rate Estimation

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Case Study: Soft Error Rate Analysis in Storage Systems

25th IEEE VLSI Test Symmposium (VTS'07) ◽

10.1109/vts.2007.21 ◽

2007 ◽

Author(s):

Brian Mullins ◽

Hossein Asadi ◽

Mehdi B. Tahoori ◽

David Kaeli ◽

Kevin Granlund ◽

...

Keyword(s):

Storage Systems ◽

Soft Error Rate ◽

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Soft error rate analysis for incident angle and N-well structure dependencies using small-sized alpha source in 10nm FinFET technology

2017 IEEE International Reliability Physics Symposium (IRPS) ◽

10.1109/irps.2017.7936402 ◽

2017 ◽

Author(s):

Soonyoung Lee ◽

Taiki Uemura ◽

Udit Monga ◽

Jae Hee Choi ◽

GunRae Kim ◽

...

Keyword(s):

Incident Angle ◽

Soft Error Rate ◽

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On soft error rate analysis of scaled CMOS designs

Proceedings of the 2009 International Conference on Computer-Aided Design - ICCAD '09 ◽

10.1145/1687399.1687428 ◽

2009 ◽

Author(s):

Huan-Kai Peng ◽

Charles H.-P. Wen ◽

Jayanta Bhadra

Keyword(s):

Soft Error Rate ◽

Rate Analysis ◽

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Spatial-correlation-aware soft error rate analysis using quasi-importance sampling

Proceedings of Technical Program of 2012 VLSI Design, Automation and Test ◽

10.1109/vlsi-dat.2012.6212616 ◽

2012 ◽

Author(s):

Xin-Tian Wu ◽

Kai-Hua Hsu ◽

Lynn C.-L Chang ◽

Charles H.-P Wen

Keyword(s):

Spatial Correlation ◽

Importance Sampling ◽

Soft Error Rate ◽

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Soft Error Rate Analysis for Combinational Logic Using an Accurate Electrical Masking Model

IEEE Transactions on Dependable and Secure Computing ◽

10.1109/tdsc.2009.29 ◽

2011 ◽

Vol 8 (1) ◽

pp. 137-146 ◽

Author(s):

Feng Wang ◽

Yuan Xie

Keyword(s):

Combinational Logic ◽

Soft Error Rate ◽

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Soft Error Rate Analysis for Sequential Circuits

2007 Design, Automation & Test in Europe Conference & Exhibition ◽

10.1109/date.2007.364500 ◽

2007 ◽

Author(s):

Natasa Miskov-Zivanov ◽

Diana Marculescu

Keyword(s):

Sequential Circuits ◽

Soft Error Rate ◽

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