2017 IEEE International Reliability Physics Symposium (IRPS)
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9781509066414
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Impact of TSV process on 14nm FEOL and BEOL reliability

2017 ◽  
Author(s):  
Sukeshwar Kannan ◽  
C. S. Premachandran ◽  
Daniel Smith ◽  
Rakesh Ranjan ◽  
Salvatore Cimino ◽  
...  

Reliability of hybrid-drain-embedded gate injection transistor

2017 ◽  
Author(s):  
Kenichiro Tanaka ◽  
Tatsuo Morita ◽  
Masahiro Ishida ◽  
Tsuguyasu Hatsuda ◽  
Tetsuzo Ueda ◽  
...  

New insights on strained SiGe channels pFET NBTI reliability

2017 ◽  
Author(s):  
C. Ndiaye ◽  
A. Biavaix ◽  
M. Aiabi ◽  
R. Berthelon ◽  
V. Huard ◽  
...  
Keyword(s):  
Strained Sige

Failure mode for p-GaN gates under forward gate stress with varying Mg concentration

2017 ◽  
Author(s):  
S. Stoffels ◽  
B. Bakeroot ◽  
T. L. Wu ◽  
D. Marcon ◽  
N. E. Posthuma ◽  
...  
Keyword(s):  
Failure Mode

Impact of processing and stack optimization on the reliability of perpendicular STT-MRAM

2017 ◽  
Author(s):  
S. Van Beek ◽  
K. Martens ◽  
P. Roussel ◽  
S. Couet ◽  
L. Souriau ◽  
...  

Evidence of mechanical degradation in microelectromechanical switches subjected to long-term stresses

2017 ◽  
Author(s):  
M. Barbato ◽  
V. Mulloni ◽  
A. Barbato ◽  
M. Silvestrini ◽  
A. Cester ◽  
...  
Keyword(s):  
Mechanical Degradation

Reliability of 2T-core CMOS OTP non-volatile memory bitcells

2017 ◽  
Author(s):  
R. Ranjan ◽  
T. Nigam ◽  
Y. Liu ◽  
A. Gondal ◽  
A. Kerber ◽  
...  
Keyword(s):  
Non Volatile Memory ◽  
Volatile Memory

Hybrid physics based-data driven approach for reliability allocation of early stage products

2017 ◽  
Author(s):  
Amit A. Kale ◽  
Jiayuan Meng ◽  
Ajay B. Kamath ◽  
Amit Marathe ◽  
Matthew Rogge ◽  
...  
Keyword(s):  
Early Stage ◽  
Data Driven ◽  
Reliability Allocation ◽  
Data Driven Approach
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