Improvement of field induced oxygen etching method preparing a gas filed ion emitter with ideal shape at the atomic level

AbstractThe principles for an electrochemical digital etching method for compound semiconductors are described and initial results reported. The method is designed to allow atomic level control over the etching process, resulting in the removal of a bilayer of the compound for each cycle. An atomic layer of one element is removed at one potential and then an atomic layer of the second element is removed at a second potential to complete one cycle. The results reported here are for the etching of CdTe. For CdTe, Te is stripped by reduction to Te2- while Cd is stripped by oxidation to Cd2+. Underpotentials are chosen so that only the top atomic layer of an element is removed. Potentials sufficient to strip the elemėnt from the bulk of the CdTe substrate are avoided. Application of the method should involve the use of a simple electrochemical cell, with solution convection. The substrate is placed in the cell and a square wave applied, where each cycle results in the dissolution of a bilayer of the compound. The two potentials of the square wave correspond to underpotential stripping potentials for Cd and Te respectively. Directions for the future development of this etching method are discussed.

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Fabrication of Gas Field Ion Emitter by Field Induced Oxygen Etching Method

e-Journal of Surface Science and Nanotechnology ◽

10.1380/ejssnt.2011.344 ◽

2011 ◽

Vol 9 ◽

pp. 344-347 ◽

Cited By ~ 10

Author(s):

Yasushi Sugiura ◽

Huarong Liu ◽

Tatsuo Iwata ◽

Shigekazu Nagai ◽

Kazuo Kajiwara ◽

...

Keyword(s):

Gas Field ◽

Etching Method ◽

Oxygen Etching

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Oxygen etching method of making an electron microscopy study of polyethylene terephthalate films

Polymer Science U S S R ◽

10.1016/0032-3950(66)90313-3 ◽

1966 ◽

Vol 8 (10) ◽

pp. 1923-1926 ◽

Cited By ~ 5

Author(s):

K.Z. Gumargaliyeva ◽

Ye.M. Belavtseva ◽

M.R. Kiselev ◽

E.I. Yevko ◽

V.M. Luk'yanovich

Keyword(s):

Electron Microscopy ◽

Polyethylene Terephthalate ◽

Microscopy Study ◽

Electron Microscopy Study ◽

Etching Method ◽

Oxygen Etching

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Atomic-level imaging of the surface structure of Ag2O

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100113160 ◽

1984 ◽

Vol 42 ◽

pp. 656-657

Author(s):

William Krakow

Keyword(s):

High Vacuum ◽

Atomic Level ◽

Ultra High Vacuum ◽

Research Groups ◽

Resolution Electron ◽

Surface Reconstructions ◽

Order Of Magnitude ◽

High Resolution Electron Microscope ◽

Saturated Structure ◽

Transmission And Reflection

In recent years electron microscopy has been used to image surfaces in both the transmission and reflection modes by many research groups. Some of this work has been performed under ultra high vacuum conditions (UHV) and apparent surface reconstructions observed. The level of resolution generally has been at least an order of magnitude worse than is necessary to visualize atoms directly and therefore the detailed atomic rearrangements of the surface are not known. The present author has achieved atomic level resolution under normal vacuum conditions of various Au surfaces. Unfortunately these samples were exposed to atmosphere and could not be cleaned in a standard high resolution electron microscope. The result obtained surfaces which were impurity stabilized and reveal the bulk lattice (1x1) type surface structures also encountered by other surface physics techniques under impure or overlayer contaminant conditions. It was therefore decided to study a system where exposure to air was unimportant by using a oxygen saturated structure, Ag2O, and seeking to find surface reconstructions, which will now be described.

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Ultrastructural study of cytoskeletal interactions with endosomes in macrophages by quickfreezing and deep-etching method

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100160431 ◽

1990 ◽

Vol 48 (3) ◽

pp. 576-577

Author(s):

Takeshi Baba ◽

Nobuki Shiozawa ◽

Masao Hotch ◽

Shinichi Ohno

Keyword(s):

Immune Complex ◽

Ultrastructural Study ◽

Fc Receptor ◽

Coated Pits ◽

Deep Etching ◽

Receptor Mediated Endocytosis ◽

Etching Method ◽

Quick Freezing

Endosomes are vesicular or tubular organelles that play important roles in transports of receptors and receptor―bound ligands during receptor-mediated endocytosis. The mechanisms of endocytic transports from clathrin-coated pits to lysosomes have been studied by many investigators. However, few studies were reported about the interactions between endosomes and cytoskeletons. In this study, Fc-receptor-mediated endocytosis in macrophages are investigated by quick-freezing and deep-etching (QF-DE) method combined with gold-labeled immune complex and “replica scraping method”.

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Surface roughness measurements of vanadium-contaminated fluidized cracking catalysts by atomic force microscopy

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100166798 ◽

1996 ◽

Vol 54 ◽

pp. 866-867

Author(s):

H. Kinney ◽

M.L. Occelli ◽

S.A.C. Gould

Keyword(s):

Surface Roughness ◽

Zeolite Y ◽

Atomic Level ◽

Microporous Structure ◽

Contact Mode ◽

Force Microscopy ◽

Atomic Force ◽

Before And After ◽

Roughness Measurements ◽

Cracking Catalysts

For this study we have used a contact mode atomic force microscope (AFM) to study to topography of fluidized cracking catalysts (FCC), before and after contamination with 5% vanadium. We selected the AFM because of its ability to well characterize the surface roughness of materials down to the atomic level. It is believed that the cracking in the FCCs occurs mainly on the catalysts top 10-15 μm suggesting that the surface corrugation could play a key role in the FCCs microactivity properties. To test this hypothesis, we chose vanadium as a contaminate because this metal is capable of irreversibly destroying the FCC crystallinity as well as it microporous structure. In addition, we wanted to examine the extent to which steaming affects the vanadium contaminated FCC. Using the AFM, we measured the surface roughness of FCCs, before and after contamination and after steaming.We obtained our FCC (GRZ-1) from Davison. The FCC is generated so that it contains and estimated 35% rare earth exchaged zeolite Y, 50% kaolin and 15% binder.

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