Among various non-destructive testing and evaluation (NDT&E) methodologies, active infrared thermography (IRT) has emerged as a viable testing technique for the inspection of materials used in various industrial applications. In recent years, pulse compression favourable IRT techniques
and the associated post-processing schemes have been proposed by various research groups to enhance the inspection capabilities of existing conventional techniques, as well as to make experimentation simple and more reliable. This paper exploits a novel complementary coded thermal wave imaging
scheme for NDT&E applications, along with the associated data processing method, to enhance the test resolution and sensitivity. The proposed scheme has been numerically modelled on a metallic sample in order to test its capabilities for subsurface defect detection and characterisation.
Probability of defect detection in pulse compression favourable thermal excitation schemes for infra-red non-destructive testing