Analysis on Reverse Drain-Induced Barrier Lowering and Negative Differential Resistance of Ferroelectric-Gate Field-Effect Transistor Memory
2017 ◽
Vol 47
(2)
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pp. 1091-1098
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2000 ◽
Vol 18
(3)
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pp. 1680
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2001 ◽
Vol 45
(7)
◽
pp. 1099-1105
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