Improving a-InGaZnO TFTs Reliability by Optimizing Electrode Capping Structure Under Negative Bias Illumination Stress
2012 ◽
Vol 43
(1)
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pp. 1133-1136
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2021 ◽
Vol 68
(9)
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pp. 4450-4454
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2019 ◽
Vol 10
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pp. 1125-1130
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2016 ◽
Vol 213
(7)
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pp. 1873-1877
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2013 ◽
Vol 52
(4R)
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pp. 041701
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2014 ◽
Vol 35
(9)
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pp. 930-932
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2020 ◽
Vol 9
(10)
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pp. 106005