The Influence of Climate Conditions and On-Skin Positioning on InGaZnO Thin-Film Transistor Performance

Thin-film transistors (TFTs) based on amorphous indium-gallium-zinc-oxide (a-IGZO) have proved promising features for flexible and lightweight electronics. To achieve technological maturity for commercial and industrial applications, their stability under extreme environmental conditions is highly required. The combined effects of temperature (T) from −30.0°C to 50.0°C and relative humidity (RH) stress from 0 to 95% on a-IGZO TFT is presented. The TFT performances and the parameters variation were analysed in two different experiments. First, the TFT response was extracted while undergoing the most extreme climate conditions on Earth, ranging from the African Desert (50.0°C, 22%) to Antarctic (−30.0°C, 0%). Afterwards, the device functionality was demonstrated in three parts of the human body (forehand, arm and foot) at low (35%), medium (60%) and high (95%) relative humidity for on-skin and wearable applications. The sensitivity to T/RH variations suggests the suitability of these TFTs as sensing element for epidermal electronics and artificial skin.

Displacement damage dose analysis of the output characteristics of In0.5Ga0.5P and Cu(In,Ga)(S,Se)2 solar cells irradiated with alpha ray simulated helium ions

To investigate applicability of radiation-hard indium–gallium–phosphide (InGaP) and copper–indium–gallium–sulfide–selenide (CIGS) solar cells to dosimeter devices without any modification, we irradiated high-energy He+ ions, which were simulated α-ray particles, to an InGaP and a CIGS solar cell. We found that both types of solar cells have sufficient resistance to He+ ions. By using displacement damage dose (DDD) analysis, the obtained He+ ion-induced degradation trends were compared with those induced by high-energy electrons, and we found that the degradation trends due to He+-ions, electrons, and protons aligned on the same curve when we plotted the data as a function of a modified DDD conversion equation, which originally was applied to space solar cells. The obtained DDD formulas enable us to predict the device lifetime or correction of an output signal for degradation when such solar cells are employed as a dosimeter.

PERFORMANCE OF DIFFERENT PHOTOVOLTAIC TECHNOLOGIES FOR AMORPHOUS SILICON (A-SI) AND COPPER INDIUM GALLIUM DI-SELENIDE (CIGS) PHOTOVOLTAIC MODULES

In this work, the analysis of performance of two types of photovoltaic (PV) (Amorphous Silicon (a-Si) Copper Indium Gallium Diselenide (CIGS) technologies were achieved out under under Iraqi (Baghdad)climate conditions. The elevation of the selected site is 9 m above ground level. The experimental work covered the eight commercially available PV technologies. The two technologies that employed in this work are, Amorphous Silicon (a-Si) and Copper Indium Gallium Diselenide (CIGS). The total period of the experimental work was 7 months, and the data were analyzed simultaneously. Special attention is given to the influence of temperature and solar radiation the performance of the PV modules. Where, it was proposed a simple I-V curve test for PV modules. The results showed that the proposed system successfully experimentally extracted I-V curves of the selected two PV modules (amorphous and CIGS solar modules). The maximum values of power (Pmax) at solar radiation intensity 750 W/m² are 2.742 W, and 2.831 W for amorphous silicon and copper indium gallium di-selenide respectively. This is occurred because the lowest solar module operating temperature (19 oC and 17 oC for solar radiation 750 and 1000 W/m2 respectively) and ambient temperature (7 oC) and for Jan., 2021 than other months. Consequently, the same behavior for the two modules at solar irradiance 1000 W/m2 with the highest power value; 2.680 W, and 3.198 W of amorphous silicon and copper indium gallium di-selenide respectively. Furthermore, the minimum values of power (Pmax) at solarradiation intensity 750 W/m² are 2.530, and 2.831 for amorphous silicon and copper indium gallium di-selenide respectively because we have the highest solar module operating temperature (57 oC, and 55 oC respectively) and ambient temperature (45 oC) for April, 2021 than other months. Consequently, the same behavior for the two modules at solar irradiance 1000 W/m2 with the highest power value; 2.680 W, and 3.198 W of amorphous silicon and copper indium gallium di-selenide respectively. The highest efficiency can be notes for CIGS solar module with a value 7.3%, while the lowest one is 5.5% for amorphous solar module.

Memory Characteristics of Thin Film Transistor with Catalytic Metal Layer Induced Crystallized Indium-Gallium-Zinc-Oxide (IGZO) Channel

The memory characteristics of a flash memory device using c-axis aligned crystal indium gallium zinc oxide (CAAC-IGZO) thin film as a channel material were demonstrated. The CAAC-IGZO thin films can replace the current poly-silicon channel, which has reduced mobility because of grain-induced degradation. The CAAC-IGZO thin films were achieved using a tantalum catalyst layer with annealing. A thin film transistor (TFT) with SiO2/Si3N4/Al2O3 and CAAC-IGZO thin films, where Al2O3 was used for the tunneling layer, was evaluated for a flash memory application and compared with a device using an amorphous IGZO (a-IGZO) channel. A source and drain using indium-tin oxide and aluminum were also evaluated for TFT flash memory devices with crystallized and amorphous channel materials. Compared with the a-IGZO device, higher on-current (Ion), improved field effect carrier mobility (μFE), a lower body trap (Nss), a wider memory window (ΔVth), and better retention and endurance characteristics were attained using the CAAC-IGZO device.

THE USE OF LIQUID PROBES BASED ON AN EUTECTIC SOLUTION FOR STUDYING THE CONDUCTING PROPERTIES OF THIN FILMS

Работа посвящена разработке модульной четрырехзондовой установки с использованием жидкого контакта на основе индий-галлиевого эвтектического раствора (EGaIn), с помощью которого можно создать прижимные жидкие контакты, не вносящие механические деформации в измеряемые структуры. Предлагается использовать данную установку для измерения вольт-амперных характеристик тонкопленочных образцов. Предполагается модульная схема измерений. Каждый зонд управляется четырьмя моторами для позиционирования и выдавливания капли из шприца для формирования нужного размера пятна контакта. Используется оптический контроль для подготовки зондов и измерения диаметра сформированных контактных областей. Подобраны параметры изготовления жидких зондов, а именно скорости выдавливания и перемещения зонда вдоль вертикальной оси для формирования капли конической формы . Управление установкой осуществляется в среде LabView. The work is devoted to development of a modular four-probe setup using a liquid contact based on an indium-gallium eutectic solution (EGaIn), which can be used to create clamping liquid contacts that do not introduce mechanical deformation into the measured structures. It is proposed to use this setup for measuring the current-voltage characteristics of thin-film samples. A modular measurement scheme is assumed. Each probe is driven by four motors to position and expel a drop from the syringe to form the desired contact area size. Optical control is used to prepare the probes and measure the diameter of the formed contact areas. The parameters for the manufacture of liquid probes are selected, namely, the speed of extrusion and movement of the probe along the vertical axis to form a conical droplet. The installation is controlled in the LabView environment.