2014 44th European Solid State Device Research Conference (ESSDERC)
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103
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Published By IEEE

9781479943760, 9781479943784
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Study of surface weak spots on SiC Schottky Diodes under specific operating regimes by Infrared Lock-in sensing

2014 ◽  
Author(s):  
Javier Leon ◽  
Xavier Perpina ◽  
Miquel Vellvehi ◽  
Xavier Jorda ◽  
Philippe Godignon
Keyword(s):  
Schottky Diodes ◽  
Lock In ◽  
Operating Regimes

Impact of Off State Stress on advanced high-K metal gate NMOSFETs

2014 ◽  
Author(s):  
Alessio Spessot ◽  
Marc Aoulaiche ◽  
Moonju Cho ◽  
Jacopo Franco ◽  
Tom Schram ◽  
...  
Keyword(s):  
Metal Gate ◽  
High K ◽  
State Stress

Impact of Random Telegraph Signals on 6T high-density SRAM in 28nm UTBB FD-SOI

2014 ◽  
Author(s):  
Kaya Can Akyel ◽  
Lorenzo Ciampolini ◽  
Olivier Thomas ◽  
David Turgis ◽  
Gerard Ghibaudo
Keyword(s):  
High Density ◽  
Random Telegraph Signals

scholarly journals Analysis of InAs-Si heterojunction nanowire tunnel FETs: Extreme confinement vs. bulk

2014 ◽  
Author(s):  
Hamilton Carrillo-Nunez ◽  
Mathieu Luisier ◽  
Andreas Schenk
Keyword(s):  
Tunnel Fets

A semiconductor memory development and manufacturing perspective

2014 ◽  
Author(s):  
Greg Atwood ◽  
Scott DeBoer ◽  
Kirk Prall ◽  
Linda Somerville
Keyword(s):  
Memory Development ◽  
Semiconductor Memory

3-D compact model for nanoscale junctionless triple-gate nanowire MOSFETs

2014 ◽  
Author(s):  
Thomas Holtij ◽  
Michael Graef ◽  
Alexander Kloes ◽  
Benjamin Iniguez
Keyword(s):  
Compact Model ◽  
Nanowire Mosfets

Impact of quantum modulation of the inversion charge in the MOSFET subthreshold regime

2014 ◽  
Author(s):  
Gaspard Hiblot ◽  
Quentin Rafhay ◽  
Frederic Boeuf ◽  
Gerard Ghibaudo
Keyword(s):  
Inversion Charge
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