2014 44th European Solid State Device Research Conference (ESSDERC)
Latest Publications

TOTAL DOCUMENTS

103

(FIVE YEARS 0)

H-INDEX

(FIVE YEARS 0)

Published By IEEE

9781479943760, 9781479943784

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Study of surface weak spots on SiC Schottky Diodes under specific operating regimes by Infrared Lock-in sensing

2014 44th European Solid State Device Research Conference (ESSDERC) ◽

10.1109/essderc.2014.6948841 ◽

2014 ◽

Author(s):

Javier Leon ◽

Xavier Perpina ◽

Miquel Vellvehi ◽

Xavier Jorda ◽

Philippe Godignon

Keyword(s):

Schottky Diodes ◽

Lock In ◽

Operating Regimes

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Impact of Off State Stress on advanced high-K metal gate NMOSFETs

2014 44th European Solid State Device Research Conference (ESSDERC) ◽

10.1109/essderc.2014.6948836 ◽

2014 ◽

Cited By ~ 6

Author(s):

Alessio Spessot ◽

Marc Aoulaiche ◽

Moonju Cho ◽

Jacopo Franco ◽

Tom Schram ◽

...

Keyword(s):

Metal Gate ◽

High K ◽

State Stress

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Analytical modelling and leakage optimization in complementary resistive switch (CRS) crossbar arrays

2014 44th European Solid State Device Research Conference (ESSDERC) ◽

10.1109/essderc.2014.6948805 ◽

2014 ◽

Author(s):

S. Ambrogio ◽

S. Balatti ◽

D. Ielmini ◽

D. C. Gilmer

Keyword(s):

Analytical Modelling ◽

Resistive Switch

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Impact of Random Telegraph Signals on 6T high-density SRAM in 28nm UTBB FD-SOI

2014 44th European Solid State Device Research Conference (ESSDERC) ◽

10.1109/essderc.2014.6948766 ◽

2014 ◽

Cited By ~ 2

Author(s):

Kaya Can Akyel ◽

Lorenzo Ciampolini ◽

Olivier Thomas ◽

David Turgis ◽

Gerard Ghibaudo

Keyword(s):

High Density ◽

Random Telegraph Signals

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Analysis of InAs-Si heterojunction nanowire tunnel FETs: Extreme confinement vs. bulk

2014 44th European Solid State Device Research Conference (ESSDERC) ◽

10.1109/essderc.2014.6948772 ◽

2014 ◽

Cited By ~ 1

Author(s):

Hamilton Carrillo-Nunez ◽

Mathieu Luisier ◽

Andreas Schenk

Keyword(s):

Tunnel Fets

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The effect of the surface fixed charge and donor traps on the C(V) and transfer characteristics of a GaN MISFET — Experiment and TCAD simulations

2014 44th European Solid State Device Research Conference (ESSDERC) ◽

10.1109/essderc.2014.6948827 ◽

2014 ◽

Cited By ~ 4

Author(s):

Giorgia Longobardi ◽

Florin Udrea ◽

Stephen Sque ◽

Jeroen Croon ◽

Fred Hurkx ◽

...

Keyword(s):

Fixed Charge ◽

Transfer Characteristics ◽

Tcad Simulations

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A semiconductor memory development and manufacturing perspective

2014 44th European Solid State Device Research Conference (ESSDERC) ◽

10.1109/essderc.2014.6948745 ◽

2014 ◽

Author(s):

Greg Atwood ◽

Scott DeBoer ◽

Kirk Prall ◽

Linda Somerville

Keyword(s):

Memory Development ◽

Semiconductor Memory

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3-D compact model for nanoscale junctionless triple-gate nanowire MOSFETs

2014 44th European Solid State Device Research Conference (ESSDERC) ◽

10.1109/essderc.2014.6948809 ◽

2014 ◽

Cited By ~ 1

Author(s):

Thomas Holtij ◽

Michael Graef ◽

Alexander Kloes ◽

Benjamin Iniguez

Keyword(s):

Compact Model ◽

Nanowire Mosfets

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Impact of etch stop layer on negative bias illumination stress of amorphous Indium Gallium Zinc Oxide transistors

2014 44th European Solid State Device Research Conference (ESSDERC) ◽

10.1109/essderc.2014.6948820 ◽

2014 ◽

Cited By ~ 1

Author(s):

Ajay Bhoolokam ◽

Manoj Nag ◽

Adrian Chasin ◽

Soeren Steudel ◽

Jan Genoe ◽

...

Keyword(s):

Zinc Oxide ◽

Negative Bias ◽

Indium Gallium Zinc Oxide ◽

Etch Stop ◽

Etch Stop Layer ◽

Indium Gallium ◽

Negative Bias Illumination Stress

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Impact of quantum modulation of the inversion charge in the MOSFET subthreshold regime

2014 44th European Solid State Device Research Conference (ESSDERC) ◽

10.1109/essderc.2014.6948816 ◽

2014 ◽

Cited By ~ 5

Author(s):

Gaspard Hiblot ◽

Quentin Rafhay ◽

Frederic Boeuf ◽

Gerard Ghibaudo

Keyword(s):

Inversion Charge

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2014 44th European Solid State Device Research Conference (ESSDERC)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Study of surface weak spots on SiC Schottky Diodes under specific operating regimes by Infrared Lock-in sensing

Impact of Off State Stress on advanced high-K metal gate NMOSFETs

Analytical modelling and leakage optimization in complementary resistive switch (CRS) crossbar arrays

Impact of Random Telegraph Signals on 6T high-density SRAM in 28nm UTBB FD-SOI

Analysis of InAs-Si heterojunction nanowire tunnel FETs: Extreme confinement vs. bulk

The effect of the surface fixed charge and donor traps on the C(V) and transfer characteristics of a GaN MISFET — Experiment and TCAD simulations

A semiconductor memory development and manufacturing perspective

3-D compact model for nanoscale junctionless triple-gate nanowire MOSFETs

Impact of etch stop layer on negative bias illumination stress of amorphous Indium Gallium Zinc Oxide transistors

Impact of quantum modulation of the inversion charge in the MOSFET subthreshold regime

2014 44th European Solid State Device Research Conference (ESSDERC)
Latest Publications