negative bias illumination stress Latest Research Papers

Excessive Oxygen Peroxide Model‐Based Analysis of Positive‐Bias‐Stress and Negative‐Bias‐Illumination‐Stress Instabilities in Self‐Aligned Top‐Gate Coplanar In–Ga–Zn–O Thin‐Film Transistors

Advanced Electronic Materials ◽

10.1002/aelm.202101062 ◽

2022 ◽

pp. 2101062

Author(s):

Sungju Choi ◽

Jingyu Park ◽

Seong‐Hyun Hwang ◽

Changwook Kim ◽

Yong‐Sung Kim ◽

...

Keyword(s):

Thin Film ◽

Thin Film Transistors ◽

Negative Bias ◽

Positive Bias ◽

Bias Stress ◽

Model Based ◽

Excessive Oxygen ◽

Model Based Analysis ◽

Negative Bias Illumination Stress

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Effect of Bandgap Widening on Negative-Bias Illumination Stress Stability of Oxide Thin-Film Transistors

IEEE Transactions on Electron Devices ◽

10.1109/ted.2021.3095135 ◽

2021 ◽

Vol 68 (9) ◽

pp. 4450-4454

Author(s):

Caihao Deng ◽

Linfeng Lan ◽

Penghui He ◽

Yaping Li ◽

Xiao Li ◽

...

Keyword(s):

Thin Film ◽

Thin Film Transistors ◽

Oxide Thin Film ◽

Negative Bias ◽

Negative Bias Illumination Stress

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Praseodymium-Doped In-Sn-Zn-O TFTs With Effective Improvement of Negative-Bias Illumination Stress Stability

IEEE Transactions on Electron Devices ◽

10.1109/ted.2021.3126278 ◽

2021 ◽

pp. 1-4

Author(s):

Hengbo Zhang ◽

Lingyan Liang ◽

Xiaolong Wang ◽

Zhendong Wu ◽

Hongtao Cao

Keyword(s):

Negative Bias ◽

Negative Bias Illumination Stress

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Analysis of Negative Bias Illumination Stress Induced Effect on LTPS and a-IGZO TFT

ECS Journal of Solid State Science and Technology ◽

10.1149/2162-8777/abc6f0 ◽

2020 ◽

Vol 9 (10) ◽

pp. 106005

Author(s):

Khushabu S. Agrawal ◽

Vilas S. Patil ◽

Eun-Chel Cho ◽

Junsin Yi

Keyword(s):

Negative Bias ◽

Igzo Tft ◽

Negative Bias Illumination Stress

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P‐3: Effects of Negative Bias Illumination Stress on IGZO Device and Luminance Behaviors in OLED Display Panel Operated by AC Conditions

SID Symposium Digest of Technical Papers ◽

10.1002/sdtp.14126 ◽

2020 ◽

Vol 51 (1) ◽

pp. 1319-1321

Author(s):

Kiju Im ◽

Hyojung Kim ◽

Hyuncheol Hwang ◽

Junehwan Kim ◽

Taeyoung Khim ◽

...

Keyword(s):

Negative Bias ◽

Oled Display ◽

Negative Bias Illumination Stress

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Improving a-InGaZnO TFTs Reliability by Optimizing Electrode Capping Structure Under Negative Bias Illumination Stress

IEEE Electron Device Letters ◽

10.1109/led.2020.3006487 ◽

2020 ◽

Vol 41 (8) ◽

pp. 1221-1224

Author(s):

Yu-Fa Tu ◽

I-Nien Lu ◽

Hong-Chih Chen ◽

Wan-Ching Su ◽

Yang-Hao Hung ◽

...

Keyword(s):

Negative Bias ◽

Negative Bias Illumination Stress

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The Effects of Valence Band Offset on Threshold Voltage Shift in a-InGaZnO TFTs Under Negative Bias Illumination Stress

IEEE Electron Device Letters ◽

10.1109/led.2020.2981176 ◽

2020 ◽

Vol 41 (5) ◽

pp. 737-740

Author(s):

Hyojung Kim ◽

Kiju Im ◽

Jongwoo Park ◽

Taeyoung Khim ◽

Hyuncheol Hwang ◽

...

Keyword(s):

Valence Band ◽

Threshold Voltage ◽

Band Offset ◽

Negative Bias ◽

Valence Band Offset ◽

Threshold Voltage Shift ◽

Voltage Shift ◽

Negative Bias Illumination Stress

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High Field Effect Mobility, Amorphous In-Ga-Sn-O Thin-Film Transistor With No Effect of Negative Bias Illumination Stress

IEEE Electron Device Letters ◽

10.1109/led.2019.2931089 ◽

2019 ◽

Vol 40 (9) ◽

pp. 1443-1446

Author(s):

Jiseob Lee ◽

Dongjin Kim ◽

Suhui Lee ◽

Johann Cho ◽

Hyungryul Park ◽

...

Keyword(s):

Thin Film ◽

Field Effect ◽

High Field ◽

Thin Film Transistor ◽

Negative Bias ◽

Field Effect Mobility ◽

Negative Bias Illumination Stress

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P‐5.2: Aqueous Sr‐doped In 2 O 3 TFT stability under negative bias illumination stress

SID Symposium Digest of Technical Papers ◽

10.1002/sdtp.13625 ◽

2019 ◽

Vol 50 (S1) ◽

pp. 728-731

Author(s):

Youhang Zhou ◽

Jun Li ◽

Yaohua Yang ◽

Xifeng Li ◽

Jianhua Zhang

Keyword(s):

Negative Bias ◽

Negative Bias Illumination Stress

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Electrical degradation behavior in metal oxide thin film transistor under negative bias-illumination stress

2019 18th International Conference on Optical Communications and Networks (ICOCN) ◽

10.1109/icocn.2019.8933923 ◽

2019 ◽

Author(s):

Youhang Zhou ◽

Jun Li ◽

Yaohua Yang ◽

Qi chen ◽

Jianhua Zhang ◽

...

Keyword(s):

Thin Film ◽

Metal Oxide ◽

Thin Film Transistor ◽

Oxide Thin Film ◽

Negative Bias ◽

Degradation Behavior ◽

Electrical Degradation ◽

Metal Oxide Thin Film ◽

Negative Bias Illumination Stress

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negative bias illumination stress
Recently Published Documents

TOTAL DOCUMENTS

H-INDEX

Excessive Oxygen Peroxide Model‐Based Analysis of Positive‐Bias‐Stress and Negative‐Bias‐Illumination‐Stress Instabilities in Self‐Aligned Top‐Gate Coplanar In–Ga–Zn–O Thin‐Film Transistors

Effect of Bandgap Widening on Negative-Bias Illumination Stress Stability of Oxide Thin-Film Transistors

Praseodymium-Doped In-Sn-Zn-O TFTs With Effective Improvement of Negative-Bias Illumination Stress Stability

Analysis of Negative Bias Illumination Stress Induced Effect on LTPS and a-IGZO TFT

P‐3: Effects of Negative Bias Illumination Stress on IGZO Device and Luminance Behaviors in OLED Display Panel Operated by AC Conditions

Improving a-InGaZnO TFTs Reliability by Optimizing Electrode Capping Structure Under Negative Bias Illumination Stress

The Effects of Valence Band Offset on Threshold Voltage Shift in a-InGaZnO TFTs Under Negative Bias Illumination Stress

High Field Effect Mobility, Amorphous In-Ga-Sn-O Thin-Film Transistor With No Effect of Negative Bias Illumination Stress

P‐5.2: Aqueous Sr‐doped In 2 O 3 TFT stability under negative bias illumination stress

Electrical degradation behavior in metal oxide thin film transistor under negative bias-illumination stress

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negative bias illumination stressRecently Published Documents

TOTAL DOCUMENTS

H-INDEX

Excessive Oxygen Peroxide Model‐Based Analysis of Positive‐Bias‐Stress and Negative‐Bias‐Illumination‐Stress Instabilities in Self‐Aligned Top‐Gate Coplanar In–Ga–Zn–O Thin‐Film Transistors

Effect of Bandgap Widening on Negative-Bias Illumination Stress Stability of Oxide Thin-Film Transistors

Praseodymium-Doped In-Sn-Zn-O TFTs With Effective Improvement of Negative-Bias Illumination Stress Stability

Analysis of Negative Bias Illumination Stress Induced Effect on LTPS and a-IGZO TFT

P‐3: Effects of Negative Bias Illumination Stress on IGZO Device and Luminance Behaviors in OLED Display Panel Operated by AC Conditions

Improving a-InGaZnO TFTs Reliability by Optimizing Electrode Capping Structure Under Negative Bias Illumination Stress

The Effects of Valence Band Offset on Threshold Voltage Shift in a-InGaZnO TFTs Under Negative Bias Illumination Stress

High Field Effect Mobility, Amorphous In-Ga-Sn-O Thin-Film Transistor With No Effect of Negative Bias Illumination Stress

P‐5.2: Aqueous Sr‐doped In 2 O 3 TFT stability under negative bias illumination stress

Electrical degradation behavior in metal oxide thin film transistor under negative bias-illumination stress

negative bias illumination stress
Recently Published Documents