Near-Field Scanning Microwave Microscopy: An Emerging Research Tool for Nanoscale Metrology

2014 ◽  
Vol 15 (1) ◽  
pp. 52-64 ◽  
Author(s):  
Atif Imtiaz ◽  
Thomas Mitchell Wallis ◽  
Pavel Kabos
Keyword(s):  
Near Field ◽  
Research Tool ◽  
Microwave Microscopy ◽  
Nanoscale Metrology ◽  
Scanning Microwave Microscopy ◽  
Near Field Scanning

scholarly journals Improvement of spatial resolution by tilt correction in near-field scanning microwave microscopy

AIP Advances ◽  
2021 ◽  
Vol 11 (3) ◽  
pp. 035114
Author(s):  
Xianfeng Zhang ◽  
Zhe Wu ◽  
Quansong Lan ◽  
Zhiliao Du ◽  
Quanxin Zhou ◽  
...  
Keyword(s):  
Spatial Resolution ◽  
Near Field ◽  
Tilt Correction ◽  
Microwave Microscopy ◽  
Scanning Microwave Microscopy ◽  
Near Field Scanning

Gallium nitride nanowire probe for near-field scanning microwave microscopy

2014 ◽  
Vol 104 (2) ◽  
pp. 023113 ◽  
Author(s):  
J. C. Weber ◽  
P. T. Blanchard ◽  
A. W. Sanders ◽  
A. Imtiaz ◽  
T. M. Wallis ◽  
...  
Keyword(s):  
Gallium Nitride ◽  
Near Field ◽  
Microwave Microscopy ◽  
Scanning Microwave Microscopy ◽  
Near Field Scanning

A three-dimensional finite element model of near-field scanning microwave microscopy

2012 ◽  
Vol 112 (8) ◽  
pp. 084318 ◽  
Author(s):  
Curtis Balusek ◽  
Barry Friedman ◽  
Darwin Luna ◽  
Brian Oetiker ◽  
Arsen Babajanyan ◽  
...  
Keyword(s):  
Finite Element ◽  
Finite Element Model ◽  
Near Field ◽  
Three Dimensional ◽  
Element Model ◽  
Microwave Microscopy ◽  
Dimensional Finite Element ◽  
Three Dimensional Finite Element ◽  
Scanning Microwave Microscopy ◽  
Near Field Scanning
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