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A Finite Element Model of Near-Field Scanning Microwave Microscopy
Journal of the Korean Physical Society
◽
10.3938/jkps.52.588
◽
2008
◽
Vol 52
(3)
◽
pp. 588-594
◽
Cited By ~ 3
Author(s):
Barry Friedman
◽
Brian Oetiker
◽
Kiejin Lee
Keyword(s):
Finite Element
◽
Finite Element Model
◽
Near Field
◽
Element Model
◽
Microwave Microscopy
◽
Scanning Microwave Microscopy
◽
Near Field Scanning
Download Full-text
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Coherent interaction with two-level fluctuators using near field scanning microwave microscopy
Scientific Reports
◽
10.1038/srep17176
◽
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Author(s):
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◽
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◽
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Instrumentation for Near-Field Scanning Microwave Microscopy
Measurement Techniques for Radio Frequency Nanoelectronics
◽
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◽
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The Distribution Measurement of the Photo-induced Plasma in Semiconductor by Near-field Scanning Microwave Microscopy
2019 Photonics & Electromagnetics Research Symposium - Fall (PIERS - Fall)
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10.1109/piers-fall48861.2019.9021849
◽
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Author(s):
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◽
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◽
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◽
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Gallium nitride nanowire probe for near-field scanning microwave microscopy
Applied Physics Letters
◽
10.1063/1.4861862
◽
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◽
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◽
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◽
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◽
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◽
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Adaptive and robust statistical methods for processing near-field scanning microwave microscopy images
Ultramicroscopy
◽
10.1016/j.ultramic.2014.11.014
◽
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◽
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◽
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◽
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◽
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◽
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◽
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◽
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Quantitative Theory for Probe-Sample Interaction With Inhomogeneous Perturbation in Near-Field Scanning Microwave Microscopy
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◽
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◽
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2016 IEEE MTT-S International Microwave Symposium (IMS)
◽
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◽
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◽
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◽
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