Measurement Techniques for Radio Frequency Nanoelectronics
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Published By Cambridge University Press

9781316343098

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Instrumentation for Near-Field Scanning Microwave Microscopy

Measurement Techniques for Radio Frequency Nanoelectronics ◽

10.1017/9781316343098.007 ◽

2017 ◽

pp. 104-122

Author(s):

T. Mitch Wallis ◽

Pavel Kabos

Keyword(s):

Microwave Microscopy ◽

Scanning Microwave Microscopy ◽

Near Field Scanning

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Extreme Impedance Measurements

Measurement Techniques for Radio Frequency Nanoelectronics ◽

10.1017/9781316343098.003 ◽

2017 ◽

pp. 36-51

Author(s):

T. Mitch Wallis ◽

Pavel Kabos

Keyword(s):

Impedance Measurements

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Core Concepts of Microwave and RF Measurements

Measurement Techniques for Radio Frequency Nanoelectronics ◽

10.1017/9781316343098.002 ◽

2017 ◽

pp. 11-35

Author(s):

T. Mitch Wallis ◽

Pavel Kabos

Keyword(s):

Core Concepts ◽

Rf Measurements

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Nanoscale Electromagnetic Measurements for Life Science Applications

Measurement Techniques for Radio Frequency Nanoelectronics ◽

10.1017/9781316343098.014 ◽

2017 ◽

pp. 279-306

Author(s):

T. Mitch Wallis ◽

Pavel Kabos

Keyword(s):

Life Science ◽

Electromagnetic Measurements

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Measurement of Active Nanoelectronic Devices

Measurement Techniques for Radio Frequency Nanoelectronics ◽

10.1017/9781316343098.010 ◽

2017 ◽

pp. 187-202

Author(s):

T. Mitch Wallis ◽

Pavel Kabos

Keyword(s):

Nanoelectronic Devices

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Radio Frequency Scanning Probe Measurements of Materials

Measurement Techniques for Radio Frequency Nanoelectronics ◽

10.1017/9781316343098.009 ◽

2017 ◽

pp. 149-186

Author(s):

T. Mitch Wallis ◽

Pavel Kabos

Keyword(s):

Radio Frequency ◽

Scanning Probe ◽

Frequency Scanning ◽

Probe Measurements

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Depth Profiling

Measurement Techniques for Radio Frequency Nanoelectronics ◽

10.1017/9781316343098.012 ◽

2017 ◽

pp. 222-250

Author(s):

T. Mitch Wallis ◽

Pavel Kabos

Keyword(s):

Depth Profiling

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Modeling and Validation of RF Nanoelectronic Devices

Measurement Techniques for Radio Frequency Nanoelectronics ◽

10.1017/9781316343098.005 ◽

2017 ◽

pp. 67-89

Author(s):

T. Mitch Wallis ◽

Pavel Kabos

Keyword(s):

Nanoelectronic Devices

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Dopant Profiling in Semiconductor Nanoelectronics

Measurement Techniques for Radio Frequency Nanoelectronics ◽

10.1017/9781316343098.011 ◽

2017 ◽

pp. 203-221

Author(s):

T. Mitch Wallis ◽

Pavel Kabos

Keyword(s):

Dopant Profiling

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Probe-Based Measurement Systems

Measurement Techniques for Radio Frequency Nanoelectronics ◽

10.1017/9781316343098.008 ◽

2017 ◽

pp. 123-148

Author(s):

T. Mitch Wallis ◽

Pavel Kabos

Keyword(s):

Measurement Systems

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