Analysis of the radiation hardness and charge collection efficiency of thinned silicon diodes

2005 ◽  
Author(s):  
M. Boscardin ◽  
M. Bruzzi ◽  
A. Candelori ◽  
G.-F. Dalla Betta ◽  
E. Focardi ◽  
...  
Keyword(s):  
Collection Efficiency ◽  
Radiation Hardness ◽  
Charge Collection ◽  
Charge Collection Efficiency

Study of Ion Induced Damage in 4H-SiC

2005 ◽  
Vol 483-485 ◽  
pp. 389-392 ◽  
Author(s):  
A. Lo Giudice ◽  
P. Oliveira ◽  
F. Fizzotti ◽  
Claudio Manfredotti ◽  
E. Vittone ◽  
...  
Keyword(s):  
Schottky Diode ◽  
Collection Efficiency ◽  
Radiation Hardness ◽  
Experimental Results ◽  
Charge Collection ◽  
Charge Collection Efficiency ◽  
Fitting Procedure ◽  
Mev Protons

The damage produced by 2 MeV protons on a 4H-SiC Schottky diode has been investigated by monitoring the charge collection efficiency as the function of the ion fluence. A new algorithm based on the Shockley-Ramo-Gunn theorem has been developed to interpret the experimental results. The fitting procedure provides a parameter which is proportional to the average number of active electrical traps generated by a single ion, which can be profitably used to estimate the radiation hardness of the material.

Radiation hardness and charge collection efficiency of lithium irradiated thin silicon diodes

2005 ◽  
Vol 52 (4) ◽  
pp. 1048-1053 ◽  
Author(s):  
M. Boscardin ◽  
M. Bruzzi ◽  
A. Candelori ◽  
G.-F.D. Betta ◽  
E. Focardi ◽  
...  
Keyword(s):  
Collection Efficiency ◽  
Radiation Hardness ◽  
Charge Collection ◽  
Charge Collection Efficiency ◽  
Thin Silicon

3D imaging of radiation damage in silicon sensor and spatial mapping of charge collection efficiency

2013 ◽  
Vol 8 (03) ◽  
pp. C03023-C03023 ◽  
Author(s):  
M Jakubek ◽  
J Jakubek ◽  
J Zemlicka ◽  
M Platkevic ◽  
V Havranek ◽  
...  
Keyword(s):  
Radiation Damage ◽  
3D Imaging ◽  
Collection Efficiency ◽  
Charge Collection ◽  
Spatial Mapping ◽  
Charge Collection Efficiency ◽  
Silicon Sensor

Comparative Studies of Ionizing Radiation Detectors Made on the Basis of Various Types of Diamond Plates

2021 ◽  
Vol 23 (2) ◽  
pp. 68-75
Author(s):  
Altukhov A.A. ◽  
Keyword(s):  
Ionizing Radiation ◽  
Single Crystal ◽  
Comparative Studies ◽  
Collection Efficiency ◽  
Radiation Detectors ◽  
Charge Collection ◽  
Alpha Radiation ◽  
Charge Collection Efficiency ◽  
Polarization Phenomena

The results of experiments on the study of polarization phenomena and the charge collection efficiency in test structures of diamond ionizing radiation detectors using diamond plates of various types, including single-crystal NRNT-type, single-crystal CVD-type, as well as polycrystalline type, when exposed to alpha-radiation with an energy of 5.5 MeV are presented. Studies have demonstrated the existence of a number of problems with the device quality of diamond plates that affect the performance of spec-trometric-type detectors.

Degradation of Charge Collection Efficiency Obtained for 6H-SiC n+p Diodes Irradiated with Gold Ions

2007 ◽  
pp. 913-916
Author(s):  
Takeshi Ohshima ◽  
Takahiro Satoh ◽  
Masakazu Oikawa ◽  
Shinobu Onoda ◽  
Shigeomi Hishiki ◽  
...  
Keyword(s):  
Collection Efficiency ◽  
Charge Collection ◽  
Charge Collection Efficiency
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