Optical emission spectroscopy characterization of a hydrogen diluted silane plasma for microcrystalline silicon thin film deposition

Author(s):  
C. H. Chang ◽  
C. C. Du ◽  
K. C. Chen ◽  
J. R. Huang ◽  
Y. L. Chang ◽  
...  
1986 ◽  
Vol 68 ◽  
Author(s):  
H. U. Lee ◽  
R. C. Ross ◽  
J. P. De Neufville

AbstractUsing optical emission spectroscopy (OES), mass spectrometry (MS), and laser-induced fluorescence (LIF), we are investigating a number of glow-discharge reactions as a function of RF power, flow rates, partial pressures, and H2 dilution under realistic thin-film deposition conditions.In this paper we report on the preliminary results of two studies: 1)The formation of radical and polymeric species in SiH4 and Si2H6 plasmas, and2)The characterization of SiF4 + H2 plasmas and the detection of HSiCl and HSiF in the plasmas of SiH2Cl2 and SiH2F2, respectively.


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