Reliability assessment of high temperature electronics and packaging technologies for Venus mission

Author(s):  
Yuan Chen ◽  
Linda Del Castillo ◽  
Nazeeh Aranki ◽  
Chris Assad ◽  
Mike Mazzola ◽  
...  
2000 ◽  
Author(s):  
Vladimir Dmitriev ◽  
T. P. Chow ◽  
Steven P. DenBaars ◽  
Michael S. Shur ◽  
Michael G. Spencer

2013 ◽  
Vol 53 (9-11) ◽  
pp. 1581-1586 ◽  
Author(s):  
F.L. Lau ◽  
Riko. I Made ◽  
W.N. Putra ◽  
J.Z. Lim ◽  
V.C. Nachiappan ◽  
...  

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