A free-space method for S-parameter measurement of semiconductor materials at microwave frequencies
Keyword(s):
2005 ◽
Vol 46
(1)
◽
pp. 72-78
◽
Keyword(s):
Keyword(s):
2009 ◽
Vol 42
(6)
◽
pp. 550-557
◽
Keyword(s):
1989 ◽
Vol 38
(3)
◽
pp. 789-793
◽
Keyword(s):
Keyword(s):
2013 ◽
Vol 51
◽
pp. 307-328
◽
Keyword(s):