Traceability Chain from Dimensional to Impedance for S parameter Measurement up to Millimeter Wave Frequencies

2021 29th Signal Processing and Communications Applications Conference (SIU) ◽

10.1109/siu53274.2021.9477971 ◽

2021 ◽

Author(s):

Erkan Danaci ◽

Handan Sakarya ◽

Murat Arslan

Keyword(s):

Millimeter Wave ◽

Parameter Measurement ◽

Traceability Chain ◽

S Parameter

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Comparison between a vector multiport network analyzer and the national S-parameter: measurement system

Proceedings of Conference on Precision Electromagnetic Measurements Digest ◽

10.1109/cpem.1994.333411 ◽

2002 ◽

Cited By ~ 1

Author(s):

A. Ferrero ◽

F. Sanpietro ◽

U. Pisani ◽

L. Brunetti

Keyword(s):

Measurement System ◽

Parameter Measurement ◽

Network Analyzer ◽

S Parameter ◽

Multiport Network

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FDTD based numerical Green's function for S-parameter measurement in inverse scattering problems

2015 USNC-URSI Radio Science Meeting (Joint with AP-S Symposium) ◽

10.1109/usnc-ursi.2015.7303341 ◽

2015 ◽

Author(s):

Guanbo Chen ◽

John Stang ◽

Mahta Moghaddam

Keyword(s):

Green’S Function ◽

Inverse Scattering ◽

Green's Function ◽

Parameter Measurement ◽

Scattering Problems ◽

Inverse Scattering Problems ◽

S Parameter

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A direct extraction method to determine the extrinsic resistances for an InP HBT device based on S-parameter measurement up to 110GHz

Semiconductor Science and Technology ◽

10.1088/1361-6641/ab8b1e ◽

2020 ◽

Vol 35 (7) ◽

pp. 075025

Author(s):

Ao Zhang ◽

Jianjun Gao

Keyword(s):

Extraction Method ◽

Parameter Measurement ◽

Direct Extraction ◽

S Parameter

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Calibration on the Fly—A Novel Two-Port S-Parameter Measurement Method for On-Wafer Leaky Systems

IEEE Transactions on Microwave Theory and Techniques ◽

10.1109/tmtt.2020.2988461 ◽

2020 ◽

Vol 68 (8) ◽

pp. 3558-3564

Author(s):

Aihua Wu ◽

Chen Liu ◽

Faguo Liang ◽

Xuefeng Zou ◽

Yibang Wang ◽

...

Keyword(s):

Measurement Method ◽

Parameter Measurement ◽

S Parameter

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New 3D-TRL structures for on-wafer calibration For high frequency S-parameter measurement

2015 European Microwave Conference (EuMC) ◽

10.1109/eumc.2015.7345726 ◽

2015 ◽

Cited By ~ 3

Author(s):

Potereau Manuel ◽

Sebastien Fregonese ◽

Arnaud Curutchet ◽

Peter Baureis ◽

Thomas Zimmer

Keyword(s):

High Frequency ◽

Parameter Measurement ◽

S Parameter

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Conducted susceptibility diagnosis of vehicle electronic module using correlation between mixed-mode S-parameter measurement and bulk current injection test

2009 3rd International Conference on Anti-counterfeiting, Security, and Identification in Communication ◽

10.1109/icasid.2009.5277022 ◽

2009 ◽

Cited By ~ 1

Author(s):

C.-Y. Ho ◽

C.-H. Huang ◽

T.-S. Horng ◽

L.-F. Huang ◽

H.-C. Lee ◽

...

Keyword(s):

Mixed Mode ◽

Current Injection ◽

Parameter Measurement ◽

Injection Test ◽

S Parameter

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Cable Fault Characterization by Time-Domain Analysis From S-Parameter Measurement and Sparse Inverse Chirp-Z Transform

IEEE Sensors Journal ◽

10.1109/jsen.2020.2990929 ◽

2021 ◽

Vol 21 (2) ◽

pp. 1009-1016

Author(s):

Guilherme Heim Weber ◽

Hector Lise de Moura ◽

Daniel Rodrigues Pipa ◽

Cicero Martelli ◽

Jean Carlos Cardozo da Silva ◽

...

Keyword(s):

Time Domain ◽

Time Domain Analysis ◽

Domain Analysis ◽

Parameter Measurement ◽

S Parameter ◽

Fault Characterization

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Influence of Non-Ideal TRM calibration Items to S-Parameter Measurement

2019 International Conference on Microwave and Millimeter Wave Technology (ICMMT) ◽

10.1109/icmmt45702.2019.8992439 ◽

2019 ◽

Author(s):

Tingming Guo ◽

Jiangtao Su ◽

Zheng Xing ◽

Jianhua Wang

Keyword(s):

Parameter Measurement ◽

S Parameter

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On-Wafer GaAs Schottky Diode Characterization Using an Integrated Pulse I-V/Pulse S-Parameter Measurement System

19th ARFTG Conference Digest ◽

10.1109/arftg.1991.324036 ◽

1991 ◽

Author(s):

Peter B. Winson ◽

Sam D. Pritchett

Keyword(s):

Schottky Diode ◽

Measurement System ◽

Parameter Measurement ◽

S Parameter

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Partial and indirect non-reciprocal S-parameter measurement for (m + n)-port fixture with DUT

2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (EMC/APEMC) ◽

10.1109/isemc.2018.8393874 ◽

2018 ◽

Author(s):

Yuya Kojima ◽

Toshikazu Sekine ◽

Yasuhiro Takahashi ◽

Noboru Maeda ◽

Shinji Fukui ◽

...

Keyword(s):

Parameter Measurement ◽

S Parameter

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