Low frequency noise (LFN) characteristics of SiGe channel SOI dynamic threshold MOSFETs (SiGe-SOI-DTMOS) for low-power applications
HEMTs for low-power and low-frequency noise 4.2 K cryoelectronics : fabrication and characterization
1998 ◽
Vol 08
(PR3)
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pp. Pr3-131-Pr3-134
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Keyword(s):
2011 ◽
Vol 32
(11)
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pp. 1597-1599
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2002 ◽
Vol 12
(3)
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pp. 121-124
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Keyword(s):
Keyword(s):
2001 ◽
Vol 41
(6)
◽
pp. 855-860
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Keyword(s):