Digest. International Electron Devices Meeting,
Latest Publications

TOTAL DOCUMENTS

223

(FIVE YEARS 0)

H-INDEX

33

(FIVE YEARS 0)

Published By IEEE

0780374622

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Ferromagnetic RF inductors and transformers for standard CMOS/BiCMOS

Digest. International Electron Devices Meeting, ◽

10.1109/iedm.2002.1175882 ◽

2003 ◽

Author(s):

Y. Zhuang ◽

M. Vroubel ◽

B. Rejaei ◽

J.N. Burghartz

Keyword(s):

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A novel silicon Geiger-mode avalanche photodiode

Digest. International Electron Devices Meeting, ◽

10.1109/iedm.2002.1175958 ◽

2003 ◽

Author(s):

J.C. Jackson ◽

A.P. Morrison ◽

D. Phelan ◽

A. Mathewson

Keyword(s):

Avalanche Photodiode ◽

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High mobility p-channel germanium MOSFETs with a thin Ge oxynitride gate dielectric

Digest. International Electron Devices Meeting, ◽

10.1109/iedm.2002.1175873 ◽

2003 ◽

Author(s):

Huiling Shang ◽

H. Okorn-Schmidt ◽

K.K. Chan ◽

M. Copel ◽

J.A. Ott ◽

...

Keyword(s):

Gate Dielectric ◽

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Correlated defect generation in thin oxides and its impact on Flash reliability

Digest. International Electron Devices Meeting, ◽

10.1109/iedm.2002.1175799 ◽

2003 ◽

Author(s):

D. Ielmini ◽

A.S. Spinelli ◽

A.L. Lacaita ◽

M.J. van Duuren

Keyword(s):

Defect Generation

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A sub-400°C germanium MOSFET technology with high-κ dielectric and metal gate

Digest. International Electron Devices Meeting, ◽

10.1109/iedm.2002.1175872 ◽

2003 ◽

Author(s):

Chi On Chui ◽

Hyoungsub Kim ◽

D. Chi ◽

B.B. Triplett ◽

P.C. McIntyre ◽

...

Keyword(s):

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Analysis of reliability in low-temperature poly-Si thin film transistors using pico-second time-resolved emission microscope

Digest. International Electron Devices Meeting, ◽

10.1109/iedm.2002.1175907 ◽

2003 ◽

Author(s):

Y. Uraoka ◽

N. Hirai ◽

H. Yano ◽

T. Hatayama ◽

T. Fuyuki

Keyword(s):

Thin Film ◽

Low Temperature ◽

Thin Film Transistors ◽

Time Resolved ◽

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Photonic bandgap based designs for nano-photonic integrated circuits

Digest. International Electron Devices Meeting, ◽

10.1109/iedm.2002.1175769 ◽

2003 ◽

Author(s):

E. Yablonovitch

Keyword(s):

Integrated Circuits ◽

Photonic Bandgap ◽

Photonic Integrated Circuits

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Charge trapping in high k gate dielectric stacks

Digest. International Electron Devices Meeting, ◽

10.1109/iedm.2002.1175893 ◽

2003 ◽

Author(s):

S. Zafar ◽

A. Callegari ◽

E. Gusev ◽

M.V. Fischetti

Keyword(s):

Gate Dielectric ◽

Charge Trapping ◽

High K ◽

High K Gate Dielectric

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Fluorine diffusion: models and experiments

Digest. International Electron Devices Meeting, ◽

10.1109/iedm.2002.1175978 ◽

2003 ◽

Author(s):

R.R. Robison ◽

M.E. Law

Keyword(s):

Diffusion Models

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A DNA prism: physical principles for optimizing a microfabricated DNA separation device

Digest. International Electron Devices Meeting, ◽

10.1109/iedm.2002.1175815 ◽

2003 ◽

Author(s):

L.R. Huang ◽

J.O. Tegenfeldt ◽

J.C. Sturm ◽

R.H. Austin ◽

E.C. Cox

Keyword(s):

Dna Separation ◽

Separation Device ◽

Physical Principles

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