2003 IEEE International Conference on Robotics and Automation (Cat No 03CH37422) SOI-03)
Latest Publications

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0780378156

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Fully-depleted SOI process optimization for 60 nm CMOS transistors

2003 IEEE International Conference on Robotics and Automation (Cat No 03CH37422) SOI-03) ◽

10.1109/soi.2003.1242885 ◽

2003 ◽

Author(s):

Fenouillet-Beranger ◽

Fruleux ◽

Talbot ◽

Tosti ◽

Palla ◽

...

Keyword(s):

Process Optimization ◽

Fully Depleted ◽

Cmos Transistors

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The role of dynamic threshold shifts in the performance of inverters and NAND gates in PD SOI technology

2003 IEEE International Conference on Robotics and Automation (Cat No 03CH37422) SOI-03) ◽

10.1109/soi.2003.1242941 ◽

2003 ◽

Cited By ~ 1

Author(s):

Ketchen

Keyword(s):

Dynamic Threshold ◽

Soi Technology

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A low power four transistor Schmitt Trigger for asymmetric double gate fully depleted SOI devices

2003 IEEE International Conference on Robotics and Automation (Cat No 03CH37422) SOI-03) ◽

10.1109/soi.2003.1242882 ◽

2003 ◽

Cited By ~ 18

Author(s):

Cakici ◽

Bansal ◽

Roy

Keyword(s):

Low Power ◽

Schmitt Trigger ◽

Double Gate ◽

Fully Depleted ◽

Soi Devices

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Author index

2003 IEEE International Conference on Robotics and Automation (Cat No 03CH37422) SOI-03) ◽

10.1109/soi.2003.1242946 ◽

2003 ◽

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NiSi MOCVD for fabricating FinFETs and UTB-SOI devices

2003 IEEE International Conference on Robotics and Automation (Cat No 03CH37422) SOI-03) ◽

10.1109/soi.2003.1242902 ◽

2003 ◽

Author(s):

Ogura ◽

Wakabayashi ◽

Ishikawa ◽

Kada ◽

Machida ◽

...

Keyword(s):

Soi Devices

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High resolution 2D Scanning Spreading Resistance Microscopy (SSRM) of thin film SOI MOSFETs with ultra short effective channel length

2003 IEEE International Conference on Robotics and Automation (Cat No 03CH37422) SOI-03) ◽

10.1109/soi.2003.1242887 ◽

2003 ◽

Author(s):

Hartwich ◽

Alvarez ◽

Dreeskornfeld ◽

Hofmann ◽

Kretz ◽

...

Keyword(s):

Thin Film ◽

High Resolution ◽

Channel Length ◽

Spreading Resistance ◽

Effective Channel

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Photon back-scatter analysis of SOI wafers

2003 IEEE International Conference on Robotics and Automation (Cat No 03CH37422) SOI-03) ◽

10.1109/soi.2003.1242894 ◽

2003 ◽

Author(s):

Zingg ◽

Orazio

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Elimination of parasitic channels in fully depleted SOI CMOS

2003 IEEE International Conference on Robotics and Automation (Cat No 03CH37422) SOI-03) ◽

10.1109/soi.2003.1242889 ◽

2003 ◽

Author(s):

Chen ◽

Wyatt ◽

Gouker ◽

Burns ◽

...

Keyword(s):

Fully Depleted ◽

Soi Cmos

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A novel local bottom-gate carbon nanotube field effect transistor on SOI

2003 IEEE International Conference on Robotics and Automation (Cat No 03CH37422) SOI-03) ◽

10.1109/soi.2003.1242899 ◽

2003 ◽

Cited By ~ 1

Author(s):

Min Zhang ◽

Chan ◽

Qi Liang ◽

Tang

Keyword(s):

Carbon Nanotube ◽

Field Effect ◽

Field Effect Transistor ◽

Effect Transistor ◽

Bottom Gate

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2003 IEEE International SOI Conference. Proceedings (Cat. No.03CH37443)

2003 IEEE International Conference on Robotics and Automation (Cat No 03CH37422) SOI-03) ◽

10.1109/soi.2003.1242875 ◽

2003 ◽

Keyword(s):

Conference Proceedings

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2003 IEEE International Conference on Robotics and Automation (Cat No 03CH37422) SOI-03)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Fully-depleted SOI process optimization for 60 nm CMOS transistors

The role of dynamic threshold shifts in the performance of inverters and NAND gates in PD SOI technology

A low power four transistor Schmitt Trigger for asymmetric double gate fully depleted SOI devices

Author index

NiSi MOCVD for fabricating FinFETs and UTB-SOI devices

High resolution 2D Scanning Spreading Resistance Microscopy (SSRM) of thin film SOI MOSFETs with ultra short effective channel length

Photon back-scatter analysis of SOI wafers

Elimination of parasitic channels in fully depleted SOI CMOS

A novel local bottom-gate carbon nanotube field effect transistor on SOI

2003 IEEE International SOI Conference. Proceedings (Cat. No.03CH37443)

2003 IEEE International Conference on Robotics and Automation (Cat No 03CH37422) SOI-03)
Latest Publications