Improved analysis of low frequency noise in dynamic threshold MOS/SOI transistors
2001 ◽
Vol 41
(6)
◽
pp. 855-860
◽
2011 ◽
Vol 32
(11)
◽
pp. 1597-1599
◽
Keyword(s):
HEMTs for low-power and low-frequency noise 4.2 K cryoelectronics : fabrication and characterization
1998 ◽
Vol 08
(PR3)
◽
pp. Pr3-131-Pr3-134
◽
Keyword(s):
Keyword(s):
1999 ◽
2002 ◽
Keyword(s):