FEM analysis of current limiting characteristics of a superconducting thin film current limiting device by the current vector potential method

IEEE Transactions on Applied Superconductivity ◽

10.1109/tasc.2003.812972 ◽

2003 ◽

Vol 13 (2) ◽

pp. 2020-2023 ◽

Author(s):

S. Sugita ◽

H. Ohsaki

Keyword(s):

Thin Film ◽

Vector Potential ◽

Fem Analysis ◽

Potential Method ◽

Superconducting Thin Film ◽

Current Vector ◽

Current Limiting

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FEM analysis of resistive superconducting fault current limiter using superconducting thin films by current vector potential method

Physica C Superconductivity ◽

10.1016/s0921-4534(02)01596-4 ◽

2002 ◽

Vol 378-381 ◽

pp. 1196-1201 ◽

Author(s):

S Sugita ◽

H Ohsaki

Keyword(s):

Vector Potential ◽

Fem Analysis ◽

Potential Method ◽

Fault Current ◽

Superconducting Thin Films ◽

Fault Current Limiter ◽

Superconducting Fault Current Limiter ◽

Current Vector ◽

Current Limiter

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FEM analysis of current limiting devices using superconducting thin film and AC losses of YBCO coated conductor

COMPEL The International Journal for Computation and Mathematics in Electrical and Electronic Engineering ◽

10.1108/03321640410553526 ◽

2004 ◽

Vol 23 (4) ◽

pp. 1092-1099 ◽

Author(s):

H. Ohsaki ◽

Y. Ichiki ◽

S. Sugita

Keyword(s):

Thin Film ◽

Fem Analysis ◽

Ac Losses ◽

Coated Conductor ◽

Superconducting Thin Film ◽

Ybco Coated Conductor ◽

Current Limiting

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Effect of inductors to mitigate the hot-spot problem in parallel-connected superconducting thin-film fault current limiting elements

Superconductor Science and Technology ◽

10.1088/0953-2048/28/6/065012 ◽

2015 ◽

Vol 28 (6) ◽

pp. 065012

Author(s):

H Yamasaki ◽

M Furuse ◽

K Kaiho

Keyword(s):

Thin Film ◽

Hot Spot ◽

Fault Current ◽

Superconducting Thin Film ◽

Current Limiting ◽

Hot Spot Problem

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Gauged Current Vector Potential and Reentrant Corners in the FEM Analysis of 3D Eddy Currents

Computational Electromagnetics - Lecture Notes in Computational Science and Engineering ◽

10.1007/978-3-642-55745-3_1 ◽

2003 ◽

pp. 1-10

Author(s):

Oszkár Bíró ◽

Kurt Preis

Keyword(s):

Vector Potential ◽

Eddy Currents ◽

Fem Analysis ◽

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Temperature Characteristics of Superconducting Thin-Film Fault Current Limiting Elements Using High-Resistivity Alloy Shunt Layers

IEEE Transactions on Applied Superconductivity ◽

10.1109/tasc.2007.898200 ◽

2007 ◽

Vol 17 (2) ◽

pp. 1843-1846 ◽

Author(s):

Kazuaki Arai ◽

Hirofumi Yamasaki ◽

Katsuyuki Kaiho ◽

Mitsuho Furuse ◽

Yoshihiko Nakagawa

Keyword(s):

Thin Film ◽

High Resistivity ◽

Fault Current ◽

Superconducting Thin Film ◽

Temperature Characteristics ◽

Current Limiting

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Normal zone propagation in superconducting thin-film fault current limiting elements with Au-Ag alloy shunt layers

Journal of Physics Conference Series ◽

10.1088/1742-6596/97/1/012031 ◽

2008 ◽

Vol 97 ◽

pp. 012031 ◽

Author(s):

K Arai ◽

H Yamasaki ◽

K Kaiho ◽

M Furuse ◽

Y Nakagawa ◽

...

Keyword(s):

Thin Film ◽

Fault Current ◽

Superconducting Thin Film ◽

Normal Zone ◽

Normal Zone Propagation ◽

Current Limiting

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Gauged current vector potential and reentrant corners in the FEM analysis of 3D eddy currents

IEEE Transactions on Magnetics ◽

10.1109/20.877575 ◽

2000 ◽

Vol 36 (4) ◽

pp. 840-843 ◽

Author(s):

K. Preis ◽

O. Biro ◽

I. Ticar

Keyword(s):

Vector Potential ◽

Eddy Currents ◽

Fem Analysis ◽

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Characteristics of Resistive Fault Current Limiting Elements Using YBCO Superconducting Thin Film With Meander-Shaped Metal Layer

IEEE Transactions on Applied Superconductivity ◽

10.1109/tasc.2009.2019040 ◽

2009 ◽

Vol 19 (3) ◽

pp. 1818-1822 ◽

Author(s):

H. Ohsaki ◽

M. Sekino ◽

S. Nonaka

Keyword(s):

Thin Film ◽

Metal Layer ◽

Fault Current ◽

Superconducting Thin Film ◽

Current Limiting

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Shielding current analysis by current-vector-potential method: Application to HTS film with multiply-connected structure

Physica C Superconductivity ◽

10.1016/j.physc.2013.04.066 ◽

2013 ◽

Vol 494 ◽

pp. 168-172 ◽

Author(s):

A. Kamitani ◽

T. Takayama ◽

S. Ikuno

Keyword(s):

Vector Potential ◽

Potential Method ◽

Current Analysis ◽

Multiply Connected ◽

Current Vector ◽

Connected Structure

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The Methodology for Determining the Status of Normal Domains in Superconducting thin Film From Input Signal

International Journal of Emerging Trends in Engineering Research ◽

10.30534/ijeter/2020/1448102020 ◽

2020 ◽

Vol 8 (10) ◽

pp. 7572-7576

Keyword(s):

Thin Film ◽

Input Signal ◽

Superconducting Thin Film ◽

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