Effect of Combined Bending Strain and Thermal Cycling on the Voltage-Current Characteristic Curves of Bi-2223 Tapes

2005 ◽  
Vol 15 (2) ◽  
pp. 2492-2494 ◽  
Author(s):  
C.Y. Shigue ◽  
C.A. Baldan ◽  
U.R. Oliveira ◽  
F.J.H. Carvalho ◽  
E.R. Filho
Keyword(s):  
Thermal Cycling ◽  
Characteristic Curves ◽  
Current Characteristic ◽  
Bending Strain ◽  
Voltage Current Characteristic

Ultrathin superconducting NbRe microstrips with hysteretic voltage-current characteristic

2020 ◽  
Vol 46 (4) ◽  
pp. 379-382
Author(s):  
C. Cirillo ◽  
M. Caputo ◽  
L. Parlato ◽  
M. Ejrnaes ◽  
D. Salvoni ◽  
...  
Keyword(s):  
Current Characteristic ◽  
Voltage Current Characteristic

An Automatic Equipment for Measure of Electrical Characteristics of Nanoelectronic Devices

2015 ◽  
Vol 1083 ◽  
pp. 211-216 ◽  
Author(s):  
A.S. Bakerenkov
Keyword(s):  
Semiconductor Devices ◽  
Relative Accuracy ◽  
Electrical Characteristics ◽  
Calibration Technique ◽  
Automatic Equipment ◽  
Current Range ◽  
Current Characteristic ◽  
Nanoelectronic Devices ◽  
Voltage Current Characteristic ◽  
Precision Voltage

An automatic equipment for measurement of voltage-current characteristic of semiconductor devices was described. The technique for precision voltage setting, which enables to obtain ±1mV accuracy in ±10V range, was described. Logarithmic current sensors were used for measurements of the current and calibration technique of the sensors was presented. It provides relative accuracy 1% in wide current range (0,1nA..10mA).

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