Post-Silicon Gate-Level Error Localization With Effective and Combined Trace Signal Selection

Author(s):  
Binod Kumar ◽  
Kanad Basu ◽  
Masahiro Fujita ◽  
Virendra Singh
Author(s):  
Irina Bystrova ◽  
E. Danil'chuk ◽  
Boris Podkopaev

The problem of constructing a diagnostic model for a network S consisting of a number of digital automata is considered, provided that the diagnostic models of all network components are known. It is assumed that these models are given by systems of logical equations, and the errors to be detected are localized in any but a single component of the network.


2014 ◽  
Vol 31 (1) ◽  
pp. 83-92 ◽  
Author(s):  
Maksim Jenihhin ◽  
Anton Tsepurov ◽  
Valentin Tihhomirov ◽  
Jaan Raik ◽  
Hanno Hantson ◽  
...  

2010 ◽  
Vol 36 (6) ◽  
pp. 582-588 ◽  
Author(s):  
Kazuhiro Takeda ◽  
Takashi Hamaguchi ◽  
Masaru Noda ◽  
Naoki Kimura ◽  
Toshiaki Itoh

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