Post-Silicon Gate-Level Error Localization With Effective and Combined Trace Signal Selection
2020 ◽
Vol 39
(1)
◽
pp. 248-261
◽
2012 ◽
Vol E95.A
(6)
◽
pp. 1030-1040
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Keyword(s):
2011 ◽
Vol 33
(4)
◽
pp. 1031-1042
◽
2010 ◽
Vol 36
(6)
◽
pp. 582-588
◽