Missing-Code-Occurrence Probability Calibration Technique for DAC Nonlinearity With Supply and Reference Circuit Analysis in a SAR ADC

IEEE Transactions on Circuits and Systems I Regular Papers ◽

10.1109/tcsi.2018.2858848 ◽

2018 ◽

Vol 65 (11) ◽

pp. 3707-3719 ◽

Author(s):

Guancheng Wang ◽

Cheng Li ◽

Yan Zhu ◽

Jianyu Zhong ◽

Yan Lu ◽

...

Keyword(s):

Circuit Analysis ◽

Sar Adc ◽

Occurrence Probability ◽

Calibration Technique ◽

Reference Circuit

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High-level model based calibration technique design for SAR ADC

IOP Conference Series Materials Science and Engineering ◽

10.1088/1757-899x/1032/1/012050 ◽

2021 ◽

Vol 1032 ◽

pp. 012050

Author(s):

M N Skripnichenko

Keyword(s):

Sar Adc ◽

Calibration Technique ◽

Model Based ◽

Level Model ◽

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Signal independent digital calibration technique for SAR ADC with one bit redundancy

IEICE Electronics Express ◽

10.1587/elex.12.20150068 ◽

2015 ◽

Vol 12 (9) ◽

pp. 20150068-20150068

Author(s):

Junfeng Gao ◽

Guangjun Li

Keyword(s):

Sar Adc ◽

Digital Calibration ◽

Calibration Technique

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A 12-bit 32MS/s SAR ADC using built-in self calibration technique to minimize capacitor mismatch

2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) ◽

10.1109/dft.2014.6962078 ◽

2014 ◽

Author(s):

In-Seok Jung ◽

Yong-Bin Kim

Keyword(s):

Sar Adc ◽

Calibration Technique ◽

Self Calibration ◽

Capacitor Mismatch

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Reference-circuit analysis for high-bandwidth spin transfer torque random access memory

2015 IEEE/ACM International Symposium on Low Power Electronics and Design (ISLPED) ◽

10.1109/islped.2015.7273541 ◽

2015 ◽

Author(s):

Byungkyu Song ◽

Taehui Na ◽

Seong-Ook Jung ◽

Jung Pill Kim ◽

Seung H. Kang

Keyword(s):

Random Access ◽

Random Access Memory ◽

Circuit Analysis ◽

Spin Transfer Torque ◽

Spin Transfer ◽

Access Memory ◽

Reference Circuit ◽

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A digital background calibration technique for SAR ADC based on capacitor swapping

IEICE Electronics Express ◽

10.1587/elex.11.20140325 ◽

2014 ◽

Vol 11 (12) ◽

pp. 20140325-20140325

Author(s):

Ling Du ◽

Ning Ning ◽

Shuangyi Wu ◽

Qi Yu ◽

Yang Liu

Keyword(s):

Sar Adc ◽

Background Calibration ◽

Calibration Technique ◽

Digital Background Calibration

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A calibration technique for SAR ADC based on code density test

2015 IEEE 11th International Conference on ASIC (ASICON) ◽

10.1109/asicon.2015.7517110 ◽

2015 ◽

Author(s):

Xian Gu ◽

Xiuju He ◽

Fule Li

Keyword(s):

Sar Adc ◽

Calibration Technique ◽

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Capacitor Mismatch Calibration Technique to Improve the SFDR of 14-Bit SAR ADC

2017 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) ◽

10.1109/isvlsi.2017.97 ◽

2017 ◽

Author(s):

Hua Fan ◽

Franco Maloberti ◽

Dagang Li ◽

Daqian Hu ◽

Yuanjun Cen ◽

...

Keyword(s):

Sar Adc ◽

Calibration Technique ◽

Capacitor Mismatch

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Digital self-calibration technique based on 14-bit SAR ADC

Transactions of Tianjin University ◽

10.1007/s12209-013-2015-7 ◽

2013 ◽

Vol 19 (6) ◽

pp. 454-458

Author(s):

Yiqiang Zhao ◽

Nan Jia ◽

Peng Dai ◽

Ming Yang

Keyword(s):

Sar Adc ◽

Calibration Technique ◽

Self Calibration

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A digital background calibration technique for split DAC based SAR ADC by using redundant cycle

2015 28th IEEE International System-on-Chip Conference (SOCC) ◽

10.1109/socc.2015.7406952 ◽

2015 ◽

Author(s):

Wuguang Wang ◽

Rulin Huang ◽

Guoquan Sun ◽

Weijun Mao ◽

Xiaolei Zhu

Keyword(s):

Sar Adc ◽

Background Calibration ◽

Calibration Technique ◽

Digital Background Calibration

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A Self-Calibration Technique for Capacitor Mismatch Errors of an Interleaved SAR ADC

IEICE Transactions on Electronics ◽

10.1587/transele.e93.c.1630 ◽

2010 ◽

Vol E93-C (11) ◽

pp. 1630-1637 ◽

Author(s):

Yasuhide KURAMOCHI ◽

Masayuki KAWABATA ◽

Kouichiro UEKUSA ◽

Akira MATSUZAWA

Keyword(s):

Sar Adc ◽

Calibration Technique ◽

Self Calibration ◽

Capacitor Mismatch

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