Exploiting Resistance Drift Characteristics to Improve Reliability of LDPC-Assisted Phase-Change Memory

Author(s):  
Meng Zhang ◽  
Fei Wu ◽  
Qin Yu ◽  
Weihua Liu ◽  
Ruixiang Ma ◽  
...  
2010 ◽  
Vol 459 ◽  
pp. 140-144 ◽  
Author(s):  
You Yin ◽  
Tomoyuki Noguchi ◽  
Hiroki Ohno ◽  
Sumio Hosaka

Reliability (or stability) of multi-level storage (MLS) is the critical characteristics for multi-level cells. In order to improve reliability of MLS of phase-change memory, there are two effective approaches, (i) enlargement of the ratio between resistance levels and (ii) reduction of scattering of resistance level. On the basis of our experimental results, it is demonstrated that the Ge2Sb2Te5-based double-layered cell has a high ratio of highest to lowest levels up to two-to-three orders of magnitude, implying high reliability. The cells exhibit the possibility of stable switching for four-level storage.


Author(s):  
I. Giannopoulos ◽  
A. Sebastian ◽  
M. Le Gallo ◽  
V.P. Jonnalagadda ◽  
M. Sousa ◽  
...  

Author(s):  
S. R. Nandakumar ◽  
Irem Boybat ◽  
Jin-Ping Han ◽  
Stefano Ambrogio ◽  
Praneet Adusumilli ◽  
...  

RSC Advances ◽  
2021 ◽  
Vol 11 (36) ◽  
pp. 22479-22488
Author(s):  
Jeong Hwa Han ◽  
Hun Jeong ◽  
Hanjin Park ◽  
Hoedon Kwon ◽  
Dasol Kim ◽  
...  

Charge density differences (CDDs) on Ge–C–Sb bonds in CGST(5%) and Ge–C–Sb in CGST(10%).


2016 ◽  
Vol 49 (2) ◽  
pp. 18-26 ◽  
Author(s):  
Biplob Debnath ◽  
Alireza Haghdoost ◽  
Asim Kadav ◽  
Mohammed G. Khatib ◽  
Cristian Ungureanu

2020 ◽  
Vol 19 ◽  
pp. 820-828
Author(s):  
Nafisa Noor ◽  
Sadid Muneer ◽  
Raihan Sayeed Khan ◽  
Anna Gorbenko ◽  
Helena Silva

Sign in / Sign up

Export Citation Format

Share Document