Comparative Study of Active-Over-Metal and Metal-Over-Active Amorphous IGZO Thin-Film Transistors With Low-Frequency Noise Measurements
2012 ◽
Vol 33
(4)
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pp. 555-557
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2007 ◽
Vol 54
(5)
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pp. 1076-1082
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2013 ◽
Vol 34
(11)
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pp. 1403-1405
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2011 ◽
Vol 32
(8)
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pp. 1083-1085
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2009 ◽
Vol 30
(8)
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pp. 828-830
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