Stress Engineering During the Fabrication of InGaN/GaN Vertical Light Emitting Diodes for Reducing the Quantum Confined Stark Effect
2016 ◽
Vol 63
(12)
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pp. 4796-4801
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2012 ◽
Keyword(s):
2008 ◽
Vol 41
(16)
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pp. 165105
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Keyword(s):
2007 ◽
Vol 19
(10)
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pp. 789-791
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