A Dynamic Time Evolution Method for Concurrent Device-Circuit Aging Simulations

2019 ◽  
Vol 66 (1) ◽  
pp. 184-190 ◽  
Author(s):  
Lining Zhang ◽  
Chenyue Ma ◽  
Ying Xiao ◽  
Hanyu Zhang ◽  
Xinnan Lin ◽  
...  
2020 ◽  
pp. 167-176
Author(s):  
R. Errais ◽  
A. Senhaji ◽  
M. Mouqallid ◽  
A. Bekkaoui ◽  
Y. El Fellah ◽  
...  

Author(s):  
Pang Chen ◽  
Guo Xie ◽  
Han Liu ◽  
Lili Liang ◽  
Huan Gao ◽  
...  
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