Advantages of high level test synthesis over design for test

Proceedings of 1995 IEEE International Test Conference (ITC) ◽

10.1109/test.1995.529845 ◽

2002 ◽

Author(s):

R.K. Roy

Keyword(s):

Design For Test ◽

Test Synthesis ◽

Download Full-text

Is high level test synthesis just design for test?

Proceedings of 1995 IEEE International Test Conference (ITC) ◽

10.1109/test.1995.529846 ◽

2002 ◽

Author(s):

C. Landrault ◽

M.-L. Flottes ◽

B. Rouzeyre

Keyword(s):

Design For Test ◽

Test Synthesis ◽

Download Full-text

High-level test synthesis

Testing of Digital Systems ◽

10.1017/cbo9780511816321.016 ◽

2003 ◽

pp. 893-952

Keyword(s):

Test Synthesis ◽

Download Full-text

High-level test synthesis of digital VLSI circuits

Microelectronics Journal ◽

10.1016/s0026-2692(97)00041-4 ◽

1998 ◽

Vol 29 (6) ◽

pp. 352-353

Author(s):

Stanley L. Hurst

Keyword(s):

Vlsi Circuits ◽

Digital Vlsi ◽

Test Synthesis ◽

Download Full-text

BIST testability enhancement using high level test synthesis for behavioral and structural designs

Proceedings Sixth Asian Test Symposium (ATS'97) ◽

10.1109/ats.1997.643980 ◽

2002 ◽

Author(s):

Kowen Lai ◽

C.A. Papachristou ◽

M. Baklashov

Keyword(s):

Test Synthesis ◽

Download Full-text

An improved high-level built-in self-test synthesis algorithm

ICECS 2001. 8th IEEE International Conference on Electronics, Circuits and Systems (Cat. No.01EX483) ◽

10.1109/icecs.2001.957802 ◽

2001 ◽

Keyword(s):

Synthesis Algorithm ◽

Test Synthesis ◽

Self Test ◽

Built In Self Test ◽

Download Full-text

High-Level Test Synthesis With Hierarchical Test Generation for Delay-Fault Testability

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/tcad.2009.2026360 ◽

2009 ◽

Vol 28 (10) ◽

pp. 1583-1596 ◽

Author(s):

Sying-Jyan Wang ◽

Tung-Hua Yeh

Keyword(s):

Test Generation ◽

Delay Fault ◽

Test Synthesis ◽

Download Full-text

High-Level Test Synthesis

ACM Transactions on Design Automation of Electronic Systems ◽

10.1145/2627754 ◽

2014 ◽

Vol 19 (4) ◽

pp. 1-27 ◽

Author(s):

Selvaraj Ravi ◽

M. Joseph

Keyword(s):

Test Synthesis ◽

Download Full-text

High-Level Test Synthesis for Delay Fault Testability

2007 Design, Automation & Test in Europe Conference & Exhibition ◽

10.1109/date.2007.364565 ◽

2007 ◽

Author(s):

Sying-Jyan Wang ◽

Tung-Hua Yeh

Keyword(s):

Delay Fault ◽

Test Synthesis ◽

Download Full-text

Co-evolutionary high-level test synthesis

Proceedings of the 17th great lakes symposium on Great lakes symposium on VLSI - GLSVLSI '07 ◽

10.1145/1228784.1228805 ◽

2007 ◽

Author(s):

Soheil Aminzadeh ◽

Saeed Safari

Keyword(s):

Test Synthesis ◽

Download Full-text

A parameterized graph-based framework for high-level test synthesis

Integration ◽

10.1016/j.vlsi.2005.08.004 ◽

2006 ◽

Vol 39 (4) ◽

pp. 363-381 ◽

Author(s):

Saeed Safari ◽

Amir Hossein Jahangir ◽

Hadi Esmaeilzadeh

Keyword(s):

Test Synthesis ◽

Download Full-text