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High-level test synthesis of digital VLSI circuits
Microelectronics Journal
◽
10.1016/s0026-2692(97)00041-4
◽
1998
◽
Vol 29
(6)
◽
pp. 352-353
Author(s):
Stanley L. Hurst
Keyword(s):
Vlsi Circuits
◽
Digital Vlsi
◽
Test Synthesis
◽
High Level
Download Full-text
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References
On-Line Testing of digital VLSI circuits at Register Transfer Level using High Level Decision Diagrams
Microelectronics Journal
◽
10.1016/j.mejo.2017.08.002
◽
2017
◽
Vol 67
◽
pp. 88-100
◽
Cited By ~ 1
Author(s):
Pradeep Kumar Biswal
◽
Santosh Biswas
Keyword(s):
Register Transfer Level
◽
Vlsi Circuits
◽
Decision Diagrams
◽
Digital Vlsi
◽
Register Transfer
◽
On Line
◽
High Level
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A static noise impact analysis methodology for evaluating transient error effects in digital VLSI circuits
IEEE International Conference on Test, 2005.
◽
10.1109/test.2005.1584071
◽
2006
◽
Author(s):
Chong Zhao
◽
Xiaoliang Bai
◽
S. Dey
Keyword(s):
Impact Analysis
◽
Vlsi Circuits
◽
Digital Vlsi
◽
Analysis Methodology
◽
Noise Impact
◽
Transient Error
◽
Static Noise
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Power bus maximum voltage drop in digital VLSI circuits
Proceedings IEEE 2000 First International Symposium on Quality Electronic Design (Cat. No. PR00525)
◽
10.1109/isqed.2000.838881
◽
2002
◽
Cited By ~ 6
Author(s):
G. Bai
◽
S. Bobba
◽
I.N. Hajj
Keyword(s):
Voltage Drop
◽
Vlsi Circuits
◽
Digital Vlsi
◽
Power Bus
◽
Maximum Voltage
Download Full-text
Approximate Testing of Digital VLSI Circuits using Error Significance based Fault Analysis
2020 24th International Symposium on VLSI Design and Test (VDAT)
◽
10.1109/vdat50263.2020.9190571
◽
2020
◽
Author(s):
Sisir Kumar Jena
◽
Santosh Biswas
◽
Jatindra Kumar Deka
Keyword(s):
Fault Analysis
◽
Vlsi Circuits
◽
Digital Vlsi
Download Full-text
Tunnel FETs for Ultralow Voltage Digital VLSI Circuits: Part I—Device–Circuit Interaction and Evaluation at Device Level
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
◽
10.1109/tvlsi.2013.2293135
◽
2014
◽
Vol 22
(12)
◽
pp. 2488-2498
◽
Cited By ~ 39
Author(s):
David Esseni
◽
Manuel Guglielmini
◽
Bernard Kapidani
◽
Tommaso Rollo
◽
Massimo Alioto
Keyword(s):
Vlsi Circuits
◽
Digital Vlsi
◽
Tunnel Fets
Download Full-text
High-level test synthesis
Testing of Digital Systems
◽
10.1017/cbo9780511816321.016
◽
2003
◽
pp. 893-952
Keyword(s):
Test Synthesis
◽
High Level
Download Full-text
Special issue on analog design issues in digital VLSI circuits and systems
Analog Integrated Circuits and Signal Processing
◽
10.1007/bf00194911
◽
1996
◽
Vol 9
(3)
◽
Keyword(s):
Vlsi Circuits
◽
Analog Design
◽
Design Issues
◽
Special Issue
◽
Digital Vlsi
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Optimized decoupling concepts for digital VLSI circuits
2001 IEEE EMC International Symposium. Symposium Record. International Symposium on Electromagnetic Compatibility (Cat. No.01CH37161)
◽
10.1109/isemc.2001.950503
◽
2002
◽
Cited By ~ 2
Author(s):
J. Held
◽
T. Wolf
Keyword(s):
Vlsi Circuits
◽
Digital Vlsi
Download Full-text
Redesign strategies for digital VLSI circuits with incomplete implementation information
1998 Midwest Symposium on Circuits and Systems (Cat. No. 98CB36268)
◽
10.1109/mwscas.1998.759483
◽
2002
◽
Author(s):
M.A. Khalil
◽
Chin-Long Wey
Keyword(s):
Vlsi Circuits
◽
Digital Vlsi
Download Full-text
High-level testing for digital VLSI-a survey
Proceedings of IECON '93 - 19th Annual Conference of IEEE Industrial Electronics
◽
10.1109/iecon.1993.339044
◽
2002
◽
Cited By ~ 1
Author(s):
T. Riesgo
◽
J. Uceda
◽
F. Aldana
Keyword(s):
Digital Vlsi
◽
High Level
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