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Steps Toward a Capacitance Standard Based on Single-Electron Counting at PTB
IEEE Transactions on Instrumentation and Measurement
◽
10.1109/tim.2004.843075
◽
2005
◽
Vol 54
(2)
◽
pp. 666-669
◽
Cited By ~ 9
Author(s):
H. Scherer
◽
S.V. Lotkhov
◽
G.-D. Willenberg
◽
A.B. Zorin
Keyword(s):
Single Electron
◽
Electron Counting
◽
Capacitance Standard
Download Full-text
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References
Progress in the implementation of the capacitance standard based on single-electron counting at PTB
Conference Digest Conference on Precision Electromagnetic Measurements
◽
10.1109/cpem.2002.1034854
◽
2003
◽
Author(s):
H. Scherer
◽
G.D. Willenberg
◽
S.V. Lotkhov
◽
A.B. Zorin
◽
P. Warnecke
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◽
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◽
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Steps Towards a Capacitance Standard Based on Single-Electron Counting at PTB
2004 Conference on Precision Electromagnetic Measurements
◽
10.1109/cpem.2004.305588
◽
2004
◽
Author(s):
H. Scherer
◽
S. Lotkhov
◽
G. Willenberg
◽
A. Zorin
Keyword(s):
Single Electron
◽
Electron Counting
◽
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Electron counting capacitance standard and quantum metrology triangle experiments at PTB
Metrologia
◽
10.1088/1681-7575/aa65f9
◽
2017
◽
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◽
pp. 322-338
◽
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Author(s):
H Scherer
◽
J Schurr
◽
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◽
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◽
Capacitance Standard
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Single electron counting by self-scanning diode array in a Kron camera
Applied Optics
◽
10.1364/ao.16.002698
◽
1977
◽
Vol 16
(10)
◽
pp. 2698
◽
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Author(s):
S. B. Mende
◽
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Keyword(s):
Single Electron
◽
Diode Array
◽
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A solution for future single-electron-counting fast-readout Skipper-CCD experiments: high channel density front-end electronics design and noise performance analysis
SPIE Future Sensing Technologies
◽
10.1117/12.2580121
◽
2020
◽
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◽
Miguel Sofo Haro
◽
Jose Lipovetzky
◽
Fernando Chierchie
◽
Guillermo Fernandez Moroni
◽
...
Keyword(s):
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◽
Single Electron
◽
Noise Performance
◽
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◽
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◽
Electronics Design
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Single-Electron Counting Statistics with a Finite Frequency Bandwidth
10.7567/ssdm.2013.ps-9-19l
◽
2013
◽
Author(s):
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◽
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◽
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Single-electron counting statistics of shot noise in nanowire Si metal-oxide-semiconductor field-effect transistors
Applied Physics Letters
◽
10.1063/1.3589373
◽
2011
◽
Vol 98
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◽
pp. 193502
◽
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◽
Yukinori Ono
◽
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Keyword(s):
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◽
Shot Noise
◽
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◽
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◽
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Computing Division in the Electron Counting Paradigm using Single Electron Tunneling Technology
2006 Sixth IEEE Conference on Nanotechnology
◽
10.1109/nano.2006.1717143
◽
2006
◽
Author(s):
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◽
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◽
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Electron counting in a silicon single-electron pump
New Journal of Physics
◽
10.1088/1367-2630/17/10/103030
◽
2015
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◽
pp. 103030
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Cited By ~ 9
Author(s):
Tuomo Tanttu
◽
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Uncertainty budget for the NIST electron counting capacitance standard, ECCS-1
Metrologia
◽
10.1088/0026-1394/44/6/010
◽
2007
◽
Vol 44
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◽
pp. 505-512
◽
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◽
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◽
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