Single-electron counting statistics of shot noise in nanowire Si metal-oxide-semiconductor field-effect transistors
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1998 ◽
Vol 37
(Part 1, No. 6A)
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pp. 3257-3263
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2007 ◽
Vol E90-C
(4)
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pp. 885-894
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2018 ◽
Vol 57
(6S1)
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pp. 06HD03
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2020 ◽
Vol 8
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pp. 9-14
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