Mismatched Decoding: Error Exponents, Second-Order Rates and Saddlepoint Approximations

Jonathan Scarlett; Alfonso Martinez; Albert Guillen i Fabregas

doi:10.1109/tit.2014.2310453

Mismatched Decoding: Error Exponents, Second-Order Rates and Saddlepoint Approximations

IEEE Transactions on Information Theory ◽

10.1109/tit.2014.2310453 ◽

2014 ◽

Vol 60 (5) ◽

pp. 2647-2666 ◽

Cited By ~ 50

Author(s):

Jonathan Scarlett ◽

Alfonso Martinez ◽

Albert Guillen i Fabregas

Keyword(s):

Second Order ◽

Saddlepoint Approximations ◽

Error Exponents

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Reliability Based Design Optimization Using First, Second and Quasi-Second Order Saddlepoint Approximations

2018 AIAA Non-Deterministic Approaches Conference ◽

10.2514/6.2018-2172 ◽

2018 ◽

Author(s):

Dimitrios Papadimitriou ◽

Dionysios Panagiotopoulos ◽

Zissimos Mourelatos

Keyword(s):

Design Optimization ◽

Second Order ◽

Reliability Based Design Optimization ◽

Saddlepoint Approximations ◽

Reliability Based Design

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Disappearance Voltage Determinations Using a Convergent Beam

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100064979 ◽

1971 ◽

Vol 29 ◽

pp. 184-185

Author(s):

W. L. Bell

Keyword(s):

Second Order ◽

Objective Method ◽

Uniform Thickness ◽

Rocking Curve ◽

Crystal Perfection ◽

Kikuchi Line ◽

Central Maximum ◽

Diffraction Patterns ◽

Convergent Beam ◽

Beam Technique

Disappearance voltages for second order reflections can be determined experimentally in a variety of ways. The more subjective methods, such as Kikuchi line disappearance and bend contour imaging, involve comparing a series of diffraction patterns or micrographs taken at intervals throughout the disappearance range and selecting that voltage which gives the strongest disappearance effect. The estimated accuracies of these methods are both to within 10 kV, or about 2-4%, of the true disappearance voltage, which is quite sufficient for using these voltages in further calculations. However, it is the necessity of determining this information by comparisons of exposed plates rather than while operating the microscope that detracts from the immediate usefulness of these methods if there is reason to perform experiments at an unknown disappearance voltage.The convergent beam technique for determining the disappearance voltage has been found to be a highly objective method when it is applicable, i.e. when reasonable crystal perfection exists and an area of uniform thickness can be found. The criterion for determining this voltage is that the central maximum disappear from the rocking curve for the second order spot.

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