scholarly journals Lumped-Element Wilkinson Power Combiners Using Reactively Compensated Star/Delta Coupled Coils in 28-nm Bulk CMOS

2019 ◽  
Vol 67 (5) ◽  
pp. 1798-1811
Author(s):  
Matthew Love ◽  
Mury Thian ◽  
Floris van der Wilt ◽  
Koen van Hartingsveldt ◽  
Kave Kianush
Keyword(s):  
Power Combiners ◽  
Lumped Element ◽  
Coupled Coils ◽  
28 Nm

scholarly journals A Compact 5 GHz Lumped-Element Wilkinson Power Combiner on 28 nm Bulk CMOS

2018 ◽  
Author(s):  
Matthew Love ◽  
Mury Thian ◽  
Floris van der Wilt ◽  
Koen van Hartingsveldt ◽  
Kave Kianush
Keyword(s):  
Power Combiner ◽  
Lumped Element ◽  
5 Ghz ◽  
28 Nm

Microwave Lumped-element Vco And Multichip Power Combiners

2005 ◽  
Author(s):  
N.W. Cox ◽  
J.W. Amoss ◽  
C.T. Rucker ◽  
G.N. Hill
Keyword(s):  
Power Combiners ◽  
Lumped Element

Combining Current Imaging, EBIC/EBAC, and Electrical Probing for Fast and Reliable In-Situ Electrical Fault Isolation

2016 ◽  
Author(s):  
Stephan Kleindiek ◽  
Matthias Kemmler ◽  
Andreas Rummel ◽  
Klaus Schock
Keyword(s):  
Imaging Technique ◽  
Fault Isolation ◽  
28 Nm

Abstract Using a compact nanoprobing setup comprising eight probe tips attached to piezo-driven micromanipulators, various techniques for fault isolation are performed on 28 nm samples inside an SEM. The recently implemented Current Imaging technique is used to quickly image large arrays of contacts providing a means of locating faults.

High Speed 1-tap Decision Feedback Equalizer in 28 nm CMOS

2014 ◽  
Vol 9 (9th) ◽  
pp. 1-12
Author(s):  
Mostafa Hosny ◽  
Sameh Ibrahim ◽  
DiaaEldin Khalil ◽  
Mohamed Dessouky
Keyword(s):  
High Speed ◽  
Decision Feedback ◽  
Decision Feedback Equalizer ◽  
28 Nm
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