scholarly journals Failure Thresholds in CBRAM Due to Total Ionizing Dose and Displacement Damage Effects

2019 ◽  
Vol 66 (1) ◽  
pp. 69-76 ◽  
Author(s):  
J. L. Taggart ◽  
R. B. Jacobs-Gedrim ◽  
M. L. McLain ◽  
H. J. Barnaby ◽  
E. S. Bielejec ◽  
...  
Keyword(s):  
Total Ionizing Dose ◽  
Displacement Damage

Investigating Heavy Ion Effects on 14nm-Process FinFETs: Displacement Damage Versus Total Ionizing Dose

2021 ◽  
pp. 1-1
Author(s):  
Madeline G. Esposito ◽  
Jack E. Manuel ◽  
Aymeric Privat ◽  
T. Patrick Xiao ◽  
Diana Garland ◽  
...  
Keyword(s):  
Heavy Ion ◽  
Total Ionizing Dose ◽  
Displacement Damage ◽  
Ion Effects

Total Ionizing Dose Effects and Proton-Induced Displacement Damage on MoS2-Interlayer-MoS2 Tunneling Junctions

2019 ◽  
Vol 66 (1) ◽  
pp. 420-427 ◽  
Author(s):  
Pan Wang ◽  
Christopher J. Perini ◽  
Andrew O'Hara ◽  
Huiqi Gong ◽  
Pengfei Wang ◽  
...  
Keyword(s):  
Total Ionizing Dose ◽  
Displacement Damage ◽  
Dose Effects ◽  
Tunneling Junctions ◽  
Total Ionizing Dose Effects

scholarly journals Compendium of Total Ionizing Dose and Displacement Damage Results from NASA Goddard Spaceflight Center

2016 ◽  
Author(s):  
Michael J. Campola ◽  
Donna J. Cochran ◽  
Shannon Alt ◽  
Alvin J. Boutte ◽  
Dakai Chen ◽  
...  
Keyword(s):  
Total Ionizing Dose ◽  
Displacement Damage

scholarly journals Total Ionizing Dose and Displacement Damage Compendium of Candidate Spacecraft Electronics for NASA

2009 ◽  
Author(s):  
Donna J. Cochran ◽  
Stephen P. Buchner ◽  
Dakai Chen ◽  
Hak S. Kim ◽  
Kenneth A. LaBel ◽  
...  
Keyword(s):  
Total Ionizing Dose ◽  
Displacement Damage

Total Ionizing Dose Versus Displacement Damage Dose Induced Dark Current Random Telegraph Signals in CMOS Image Sensors

2011 ◽  
Vol 58 (6) ◽  
pp. 3085-3094 ◽  
Author(s):  
Cedric Virmontois ◽  
V. Goiffon ◽  
P. Magnan ◽  
O. Saint-Pe ◽  
S. Girard ◽  
...  
Keyword(s):  
Dark Current ◽  
Image Sensors ◽  
Total Ionizing Dose ◽  
Displacement Damage ◽  
Damage Dose ◽  
Cmos Image Sensors ◽  
Random Telegraph Signals

Proton-Induced Displacement Damage and Total-Ionizing-Dose Effects on Silicon-Based MEMS Resonators

2018 ◽  
Vol 65 (1) ◽  
pp. 34-38 ◽  
Author(s):  
Huiqi Gong ◽  
Wenjun Liao ◽  
En Xia Zhang ◽  
Andrew L. Sternberg ◽  
Michael W. McCurdy ◽  
...  
Keyword(s):  
Total Ionizing Dose ◽  
Displacement Damage ◽  
Mems Resonators ◽  
Dose Effects ◽  
Silicon Based ◽  
Total Ionizing Dose Effects
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