Investigating Heavy Ion Effects on 14nm-Process FinFETs: Displacement Damage Versus Total Ionizing Dose
2019 ◽
Vol 66
(1)
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pp. 69-76
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Keyword(s):
2019 ◽
Vol 66
(1)
◽
pp. 420-427
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Keyword(s):
2017 ◽
Vol 50
(35)
◽
pp. 355301
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2013 ◽
Vol 118
(5)
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pp. 2101-2112
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1974 ◽
pp. 881-892
Keyword(s):