2019 IEEE Radiation Effects Data Workshop
Latest Publications

TOTAL DOCUMENTS

54

(FIVE YEARS 54)

H-INDEX

1

(FIVE YEARS 1)

Published By IEEE

9781728138282

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Recent SEE Results for Snapdragon Processors

2019 IEEE Radiation Effects Data Workshop ◽

10.1109/redw.2019.8906649 ◽

2019 ◽

Author(s):

Steven M. Guertin ◽

Wilson P. Parker ◽

Andrew C. Daniel ◽

Philippe Adell

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REDW 2019 Copyright Page

2019 IEEE Radiation Effects Data Workshop ◽

10.1109/redw.2019.8906551 ◽

2019 ◽

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Proton, Gamma, and Neutron Irradiation of a 10V Precision Voltage Reference

2019 IEEE Radiation Effects Data Workshop ◽

10.1109/redw.2019.8906625 ◽

2019 ◽

Author(s):

Rutger Dungan ◽

Daniel H. Lo ◽

Thien Tran ◽

Doug Murlin ◽

Douglas Hamberg

Keyword(s):

Neutron Irradiation ◽

Voltage Reference ◽

Precision Voltage

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Heavy Ion Single Event Latchup Measurements of a Focal Plane Imager at Room and Cryogenic Temperatures

2019 IEEE Radiation Effects Data Workshop ◽

10.1109/redw.2019.8906536 ◽

2019 ◽

Author(s):

Farokh Irom ◽

Gregory R. Allen ◽

Bruce R. Hancock ◽

Giacomo Mariani

Keyword(s):

Focal Plane ◽

Heavy Ion ◽

Cryogenic Temperatures ◽

Single Event ◽

Single Event Latchup

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Proton Characterization of RTG4 Flash-Based FPGA for LEO Environment

2019 IEEE Radiation Effects Data Workshop ◽

10.1109/redw.2019.8906605 ◽

2019 ◽

Author(s):

Nadia Rezzak ◽

Jih-Jong Wang ◽

Frank Hawley ◽

Esmat Hamdy

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A Summary of MIL STD 750, Method 1017 Neutron Irradiation Tests Performed on JANSR2N3700, JANSR2N2369; JANSR2N2222; and JANSR2N2907 Bipolar Junction Transistors (July 2019)

2019 IEEE Radiation Effects Data Workshop ◽

10.1109/redw.2019.8906592 ◽

2019 ◽

Author(s):

Paul L. Schimel PE

Keyword(s):

Neutron Irradiation ◽

Bipolar Junction Transistors

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Single-Event Characterization of the 16 nm FinFET Xilinx UltraScale+TM RFSoC Field-Programmable Gate Array under Proton Irradiation

2019 IEEE Radiation Effects Data Workshop ◽

10.1109/redw.2019.8906566 ◽

2019 ◽

Author(s):

Philip Davis ◽

David S. Lee ◽

Mark Learn ◽

Doug Thorpe

Keyword(s):

Field Programmable Gate Array ◽

Proton Irradiation ◽

Single Event ◽

Field Programmable ◽

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Characterization of the Effects of 250 MeV Proton-Induced Total Ionizing Dose and Displacement Damage on the HCPL-625K Optocoupler

2019 IEEE Radiation Effects Data Workshop ◽

10.1109/redw.2019.8906608 ◽

2019 ◽

Author(s):

Scott Messenger ◽

Codie Mishler ◽

James Hack ◽

Paul Dudek

Keyword(s):

Total Ionizing Dose ◽

Displacement Damage

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NASA Goddard Space Flight Center’s Compendium of Total Ionizing Dose, Displacement Damage Dose, and Single-Event Effects Test Results

2019 IEEE Radiation Effects Data Workshop ◽

10.1109/redw.2019.8906647 ◽

2019 ◽

Author(s):

Alvson D. Topper ◽

Edward J. Wyrwas ◽

Kaitlyn Ryder ◽

Kenneth A. LaBel ◽

Jonathan A. Pellish ◽

...

Keyword(s):

Space Flight ◽

Test Results ◽

Single Event ◽

Total Ionizing Dose ◽

Displacement Damage ◽

Single Event Effects ◽

Damage Dose ◽

Nasa Goddard Space ◽

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A comparison of 0.040 rad(Si)/s and 0.010 rad(Si)s total dose results of Renesas parts proposed for the Europa Clipper mission

2019 IEEE Radiation Effects Data Workshop ◽

10.1109/redw.2019.8906612 ◽

2019 ◽

Author(s):

N. W. van Vonno ◽

J. S. Gill ◽

F. C. Ballou ◽

W. H. Newman

Keyword(s):

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