2013 IEEE Radiation Effects Data Workshop (REDW)
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Published By IEEE

9781479911394, 9781479911363, 9781479911370

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

The Reliability of Software Algorithms and Software-Based Mitigation Techniques in Digital Signal Processors

2013 IEEE Radiation Effects Data Workshop (REDW) ◽

10.1109/redw.2013.6658218 ◽

2013 ◽

Cited By ~ 5

Author(s):

Heather Quinn ◽

Tom Fairbanks ◽

Justin L. Tripp ◽

Andrea Manuzzato

Keyword(s):

Digital Signal ◽

Digital Signal Processors ◽

Software Algorithms ◽

Mitigation Techniques ◽

Signal Processors

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Characterization and Analyses of RadHard-by-Design CMOS Quad Operational Amplifiers

2013 IEEE Radiation Effects Data Workshop (REDW) ◽

10.1109/redw.2013.6658185 ◽

2013 ◽

Cited By ~ 2

Author(s):

Ray Benson ◽

Paul Resch ◽

Randall Milanowski

Keyword(s):

Operational Amplifiers

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List of authors

2013 IEEE Radiation Effects Data Workshop (REDW) ◽

10.1109/redw.2013.6658184 ◽

2013 ◽

Download Full-text

Single Event Effect and Total Ionizing Dose Results of Highly Scaled Flash Memories

2013 IEEE Radiation Effects Data Workshop (REDW) ◽

10.1109/redw.2013.6658209 ◽

2013 ◽

Cited By ~ 7

Author(s):

Farokh Irom ◽

Duc N. Nguyen ◽

Gregory R. Allen

Keyword(s):

Single Event ◽

Total Ionizing Dose ◽

Flash Memories ◽

Single Event Effect

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Compendium of Total Ionizing Dose, Displacement Damage and Single Event Transient Test Data of Various Optocouplers for ESA

2013 IEEE Radiation Effects Data Workshop (REDW) ◽

10.1109/redw.2013.6658192 ◽

2013 ◽

Cited By ~ 1

Author(s):

Marc Poizat ◽

Maryse Sauvagnac ◽

Anne Samaras ◽

Yannick Padie ◽

Pierre Garcia ◽

...

Keyword(s):

Test Data ◽

Single Event ◽

Total Ionizing Dose ◽

Single Event Transient ◽

Displacement Damage

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Reviewers

2013 IEEE Radiation Effects Data Workshop (REDW) ◽

10.1109/redw.2013.6658181 ◽

2013 ◽

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Radiation Effects of High Voltage MESFETs at the 45nm Node

2013 IEEE Radiation Effects Data Workshop (REDW) ◽

10.1109/redw.2013.6658202 ◽

2013 ◽

Author(s):

Seth J. Wilk ◽

William Lepkowski ◽

Bo Chen ◽

Jason Kam ◽

Michael Goryll ◽

...

Keyword(s):

High Voltage ◽

Radiation Effects

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SEE and TID Test Results of Candidate Electronics for LHC Power Converter Control

2013 IEEE Radiation Effects Data Workshop (REDW) ◽

10.1109/redw.2013.6658206 ◽

2013 ◽

Cited By ~ 2

Author(s):

Slawosz Uznanski ◽

Benjamin Todd ◽

Arend Dinius ◽

Quentin King ◽

Karol Motala ◽

...

Keyword(s):

Power Converter ◽

Test Results

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TID Test Results for 4th Generation iPad™

2013 IEEE Radiation Effects Data Workshop (REDW) ◽

10.1109/redw.2013.6658219 ◽

2013 ◽

Author(s):

S. M. Guertin ◽

G. R. Allen ◽

S. S. McClure ◽

K. A. LaBel

Keyword(s):

Test Results

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Single Event Effect Rate Analysis and Upset Characterization of FPGA Digital Signal Processors

2013 IEEE Radiation Effects Data Workshop (REDW) ◽

10.1109/redw.2013.6658210 ◽

2013 ◽

Cited By ~ 1

Author(s):

Roberto Monreal ◽

Gary Swift ◽

Y. C. Wang ◽

Michael Wirthlin ◽

Brent Nelson

Keyword(s):

Digital Signal ◽

Digital Signal Processors ◽

Single Event ◽

Effect Rate ◽

Rate Analysis ◽

Single Event Effect ◽

Signal Processors

Download Full-text

2013 IEEE Radiation Effects Data Workshop (REDW)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

The Reliability of Software Algorithms and Software-Based Mitigation Techniques in Digital Signal Processors

Characterization and Analyses of RadHard-by-Design CMOS Quad Operational Amplifiers

List of authors

Single Event Effect and Total Ionizing Dose Results of Highly Scaled Flash Memories

Compendium of Total Ionizing Dose, Displacement Damage and Single Event Transient Test Data of Various Optocouplers for ESA

Reviewers

Radiation Effects of High Voltage MESFETs at the 45nm Node

SEE and TID Test Results of Candidate Electronics for LHC Power Converter Control

TID Test Results for 4th Generation iPad™

Single Event Effect Rate Analysis and Upset Characterization of FPGA Digital Signal Processors

2013 IEEE Radiation Effects Data Workshop (REDW)
Latest Publications