Continuous characterization of MOSFET from low-frequency noise to thermal noise using a novel measurement system up to 100 MHz

2012 ◽  
Author(s):  
Kenji Ohmori ◽  
Ryu Hasunuma ◽  
Wei Feng ◽  
Keisaku Yamada
Keyword(s):  
Measurement System ◽  
Thermal Noise ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise

Using low-frequency noise characterization of AlGaN/GaN HEMT as a tool for technology assessment and failure prediction

2004 ◽  
Author(s):  
Jean-Guy Tartarin ◽  
Geoffroy Soubercaze-Pun ◽  
Abdelali Rennane ◽  
Laurent Bary ◽  
Robert Plana ◽  
...  
Keyword(s):  
Technology Assessment ◽  
Low Frequency ◽  
Failure Prediction ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Gan Hemt ◽  
Noise Characterization

scholarly journals Characterization of Low-Frequency Noise of MOSFETs Using 2-D Device Simulator

2001 ◽  
pp. 400-403
Author(s):  
Hyunchul Nah ◽  
Young June Park ◽  
Hong-Shick Min ◽  
Chanho Lee ◽  
Hyungsoon Shin
Keyword(s):  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise

Low-Frequency Noise Spectroscopy Characterization of HgCdTe Infrared Detectors

2020 ◽  
Vol 67 (2) ◽  
pp. 547-551 ◽  
Author(s):  
Liqi Zhu ◽  
Jian Huang ◽  
Zongheng Xie ◽  
Zhuo Deng ◽  
Lu Chen ◽  
...  
Keyword(s):  
Infrared Detectors ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Noise Spectroscopy
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